Global Standards for the Microelectronics Industry
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| Title | Document # | Date |
|---|---|---|
STANDARD LOGNORMAL ANALYSIS OF UNCENSORED DATA, AND OF SINGLY RIGHT -CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD: |
JESD37A | Aug 2017 |
This standard details techniques for estimating the values of a two parameter lognormal distribution from complete lifetime data (all samples in an experiment have failed) or singly right-censored lifetime data (the experiment have failed) or singly right-censored lifetime data gathered from rapid stress test; however, not all types of failure data can be analyzed with these techniques. Committee(s): JC-14.2 Free download. Registration or login required. |
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