Global Standards for the Microelectronics Industry
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Displaying 1 - 3 of 3 documents.
Title | Document # | Date |
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DEFINITION OF THE SSTUB32868 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS |
JESD82-14A.01 | Oct 2021 |
This standard defines standard specifications of dc interface parameters, switching parameters, and test loading for definition of the SSTUB32868 registered buffer with parity test for DDR2 RDIMM applications. SSTU32S2868 denotes a single-die implementation and SSTU32D868 denotes a dual-die implementation. This is a minor editorial revision as shown in Annex A of the document. Committee(s): JC-40 Free download. Registration or login required. |
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DEFINITION OF the SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS |
JESD82-23.01 | Jan 2023 |
Terminology update. Committee(s): JC-40 Free download. Registration or login required. |
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GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARDRelease Number: C.01 - Terminology update |
JESD212C.01 | Jan 2023 |
Terminology update. Patents(): A complete list of Assurance/Disclosure Forms is available to JEDEC members in the Members Area. Non-members can obtain individual Assurance/Disclosure Forms on request from the JEDEC office. Committee(s): JC-42.3C Free download. Registration or login required. |