Global Standards for the Microelectronics Industry
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Displaying 6 - 9 of 9 documents. Show 5 results per page.
Title | Document # |
Date![]() |
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Standard Practices and Procedures - Reflow Flatness Requirements for Ball Grid Array Packages. Item 11.2-783 |
SPP-024A | Mar 2009 |
This document states the procedures for using component land side flatness during simulated reflow as an alternative to coplanarity in certain limited cases for BGA components. Free download. Registration or login required. |
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Registration - Upper PoP Package, Square, Fine Pitch, Ball Grid Array (BGA), 0.65 and 0.50 mm and 0.40 mm Pitch. POP-XFBGA.Status: Rescinded March 2018 |
MO-273C | Mar 2011 |
The information contained in MO-273, has been moved to 3 different MO's as follows: The 0.40 mm pitch has been moved to MO-317. The 0.50 mm pitch has been moved to MO-321. The 0.65 mm pitch has been moved to MO-322. Item 11.11-941(E) |
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Registration - 204 Pin DDR3 SODIMM w/ 0.60 mm Pitch. DIM |
MO-268E | Mar 2014 |
Item 11.14-151 Patents(): Hatachi: 5,227,664 Committee(s): JC-11.14 Free download. Registration or login required. |
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Power Cycling |
JESD22-A122B | Nov 2023 |
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. Free download. Registration or login required. |