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Title	Document #	Date
IC LATCH-UP TEST	JESD78F.02	Nov 2023
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress. This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880. Committee(s): JC-14, JC-14.1 Free download. Registration or login required.

Title

Document #

Date

IC LATCH-UP TEST

JESD78F.02

Nov 2023

This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress.

This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880.

Committee(s): JC-14, JC-14.1

Free download. Registration or login required.

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IC LATCH-UP TEST

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