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Title	Document #	Date
STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS	JESD47K	Aug 2018
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. Committee(s): JC-14.3 Available for purchase: $76.00 Add to Cart To help cover the costs of producing standards, JEDEC is now charging for non-member access to selected standards and design files. Most of the content on this site remains free to download with registration. Paying JEDEC member companies enjoy free access to all content. Learn more and apply today. Paying JEDEC Members may login for free access.

Title

Document #

Date

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

JESD47K

Aug 2018

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

Committee(s): JC-14.3

Available for purchase: $76.00 Add to Cart

Paying JEDEC Members may login for free access.

Standards & Documents Search

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

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