Global Standards for the Microelectronics Industry
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STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS |
JESD47K | Aug 2018 |
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. Committee(s): JC-14.3 Available for purchase: $76.00 Add to Cart Paying JEDEC Members may login for free access. |