Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # |
Date |
|---|---|---|
Registration - Plastic Bottom Ball Grid Array, 0.75 mm Pitch Rectangular Family Package |
MO-328B | Feb 2020 |
Designator: PBGA-B#[#]_I0p75... A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11.11 Free download. Registration or login required. |
||
Registration - Plastic Bottom Grid Array Ball, 0.65 mm Pitch Square Family Package |
MO-342A | Jan 2020 |
Designator: PBGA-B#[#}_I0p65 Item: 11.11-978, Access STP Files for MO-342A Cross Reference: DR4.5 A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11.11 Free download. Registration or login required. |
||
CUSTOMER NOTIFICATION PROCESS FOR DISASTERS |
JESD246A | Jan 2020 |
This standard establishes the requirements for timely notification to affected customers after a disaster has occurred at a supplier’s facility that will affect the committed delivery of product. This standard puts specific emphasis on notification, timing, and notification content which includes risk exposure, impact analysis, and recovery plans. This standard is applicable to suppliers of, and affected customers for, solid-state products and the constituent components used within. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-14.4 Free download. Registration or login required. |
||
POWER AND TEMPERATURE CYCLING |
JESD22-A105D | Jan 2020 |
The power and temperature cycling test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes and simultaneously the operating biases are periodically applied and removed. It is intended to simulate worst case conditions encountered in application environments. The power and temperature cycling test is considered destructive and is only intended for device qualification. This test method applies to semiconductor devices that are subjected to temperature excursions and required to power on and off during all temperatures. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Free download. Registration or login required. |
||
LOW POWER DOUBLE DATA RATE (LPDDR5)Status: Superseded July 2021 |
JESD209-5A | Jan 2020 |
This document has been replaced by JESD209-5B. Item 1854.99A. Members of JC-42.6 may access a reference copy on the restricted members' website. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-42.6 |
||
