Global Standards for the Microelectronics Industry
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| Title | Document # | Date |
|---|---|---|
METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS:Status: ReaffirmedFebruary 1984 |
JEB5-A | Jan 1970 |
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered. Committee(s): JC-BOD Free download. Registration or login required. |
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