Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 1 of 1 documents.
Title | Document # | Date |
---|---|---|
MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS:Status: ReaffirmedSeptember 1981, April 2000, October 2002 |
JESD25 | Nov 1972 |
This standard provides a test method and definition for small-signal conditions at microwave frequencies. Committee(s): JC-25 Free download. Registration or login required. |