Global Standards for the Microelectronics Industry
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STANDARD FOR THE MEASUREMENT OF CREStatus: Reaffirmed April 1981, April 1999, March 2009
This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340.