Global Standards for the Microelectronics Industry
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Displaying 1 - 4 of 4 documents.
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Document # | Date |
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ALPHA RADIATION MEASUREMENT IN ELECTRONIC MATERIALS |
JESD221 | May 2011 |
This standard applies generally to gas proportional instruments and the use thereof in measuring materials with an alpha emissivity of less than 10 a·khr-1·cm-2. The primary focus will be on materials used in semiconductor fabrication. The purpose of this document is to specify the recommended method for measuring alpha emissivity in materials utilized in the manufacturing of semiconductors. The method specifically applies to gas proportional instruments and designates recommended instrument settings. In addition, the method discusses operation of ionization counters. The document also recommends methods for determining sample size and for evaluating instrument background accurately. Free download. Registration or login required. |
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Design Requirements - Ball Grid Array (BGA)Package Measuring and Methodology. |
DG-4.17C | Jul 2008 |
Item 11.2-791(S) Free download. Registration or login required. |
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PACKAGE WARPAGE MEASUREMENT OF SURFACE-MOUNT INTEGRATED CIRCUITS AT ELEVATED TEMPERATURE |
JESD22-B112B | Aug 2018 |
The purpose of this test method is to measure the deviation from uniform flatness of an integrated circuit package body for the range of environmental conditions experienced during the surface-mount soldering operation. Committee(s): JC-14.1 Free download. Registration or login required. |
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STANDARD MEASURMENTS OF THE ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR INTEGRATED CIRCUITSStatus: RescindedOct-84 |
JEB6 | Jan 1966 |
Committee(s): JCJEDC |