Global Standards for the Microelectronics Industry
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Displaying 1 - 2 of 2 documents.
| Title | Document # | Date |
|---|---|---|
MARKING PERMANENCYStatus: Reaffirmed August 2024 |
JESD22-B107D | Mar 2011 |
This test method provides two tests for determining the marking permanency of ink marked integrated circuits. A new non-destructive tape test method is introduced to quickly determine marking integrity. The test method also specifies a resistance to solvents method based upon MIL Std 883 Method 2015. Free download. Registration or login required. |
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MARK LEGIBILITY |
JESD22-B114B | Jan 2020 |
This standard describes a nondestructive test to assess solid state device mark legibility. The specification applies only to solid state devices that contain markings, regardless of the marking method. It does not define what devices must be marked or the method in which the device is marked, i.e., ink, laser, etc. The standard is limited in scope to the legibility requirements of solid state devices, and does not replace related reference documents listed in this standard. Committee(s): JC-14.1 Free download. Registration or login required. |
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