Global Standards for the Microelectronics Industry
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Title | Document # | Date |
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PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA): |
JEP147 | Oct 2003 |
This procedure describes a recommended way to measure pin capacitance of devices with SSTL (Stub Series Terminated Logic) interface pins by use of a Vector Network Analyzer. One purpose of this standard procedure is to reduce the lengthy and often inaccurate footnote - usually found around the specification of pin parasitics - to a simple reference to this document. In special cases modifying statements may adjust this procedure to the special needs of certain component. Free download. Registration or login required. |