Global Standards for the Microelectronics Industry
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Displaying 1 - 2 of 2 documents.
| Title | Document # | Date |
|---|---|---|
I/O DRIVERS AND RECEIVERS WITH CONFIGURABLE COMMUNICATION VOLTAGE, IMPEDANCE, AND RECEIVER THRESHOLD: |
JESD67 | Feb 1999 |
This standard attempts to aid in the design of electronic systems comprised of components that operate at several different supply voltages. This document covers respectively configurable I/O voltage, receiver type and switchpoint, and driver impedance. Committee(s): JC-16 Free download. Registration or login required. |
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THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method) |
JESD24-12 | Jun 2004 |
The purpose of this test method is to measure the thermal impedance of the IGBT (Insulated Gate Bipolar Transistor) under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the collector-emitter on voltage, VCE(on), is used as the junction temperature indicator. This is an alternative method to JEDEC Standard No. 24-6. Committee(s): JC-25 Free download. Registration or login required. |
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