Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 1 of 1 documents.
Title | Document # | Date |
---|---|---|
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORINGStatus: Reaffirmed June 2011, May 2022 |
JESD659C | Apr 2017 |
This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD659 after revision, September 1999. Free download. Registration or login required. |