Global Standards for the Microelectronics Industry
Standards & Documents Search
Displaying 1 - 3 of 3 documents.
| Title | Document # | Date |
|---|---|---|
USER GUIDE FOR MICROCIRCUIT FAILURE ANALYSIS:Status: RescindedNovember 2004 |
JEB16 | Jul 1970 |
This guide defines generalized procedures for the failure analysis of monolithic integrated microelectronic circuits. Although the generalized procedural steps may apply to all microelectronic circuits, additional analysis steps unique to thin/thick film hybrid devices are not covered. Committee(s): JC-14 Free download. Registration or login required. |
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SIGNATURE ANALYSIS: |
JEP136 | Jul 1999 |
Signature Analysis is a method to reduce the number of comprehensive physical failure analyses by the application of statistical inference techniques. The purpose of this document is to promote a common definition of Signature Analysis by inference, using the same statistical techniques, and to recognize that it is formal means of doing failure analysis. Committee(s): JC-14.6 Free download. Registration or login required. |
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Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification |
JEP114A | May 2023 |
This publication is a guideline to test facilities in their efforts to establish and maintain consistent particle impact noise detection (PIND) testing. Free download. Registration or login required. |
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