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Title Document # Date

RECOMMENDED ESD-CDM TARGET LEVELS

Status: Reaffirmed May 2015 		JEP157 Oct 2009

This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements.

Committee(s): JC-14, JC-14.3

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FIELD-INDUCED CHARGED-DEVICE MODEL TEST METHOD FOR ELECTROSTATIC DISCHARGE WITHSTAND THRESHOLDS OF MICROELECTRONIC COMPONENTS

Status: Rescinded February 2020 		JESD22-C101F Oct 2013

The material in this test method has been supeceded by JS-002-2018, published January 2019

Committee(s): JC-14, JC-14.1

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