Standards & Documents Search

Displaying 1 - 1 of 1 documents.

Title Document # Date

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS - FORCED CONVECTION (MOVING AIR):

 JESD51- 6 Mar 1999

This standard specifies the environmental conditions for determining thermal performance of an integrated circuit device in a forced convection environment when mounted on a standard thermal test board.

Committee(s): JC-15.1

Free download. Registration or required.

Search by Keyword or Document Number

or Reset