Global Standards for the Microelectronics Industry
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| Title | Document # | Date |
|---|---|---|
MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES:Status: Reaffirmed |
EIA318-B | Jul 1996 |
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement. Committee(s): JC-22.4 Free download. Registration or login required. |
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