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Title	Document #	Date
TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS: Status: ReaffirmedSeptember 1981, April 1999	JEP65	Dec 1967
This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data. Committee(s): JC-25 Free download. Registration or login required.
STANDARD LIST OF VALUES TO BE USED IN POWER TRANSISTOR DEVICE REGISTRATION AND MINIMUM DIFFERENCES FOR DISCRETENESS OF REGISTRATIONS - SUPERSEDED BY EIA-419-A, February 1996. Status: Rescinded	JEP74	Jan 1969
Committee(s): JC-25
LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS:	JEP79	Sep 1969
This publication is for photoconductive cells sensitive primarily in the visible and near infrared region. Free download. Registration or login required.
RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS:	JEP78	Oct 1969
The intent of this publication is to facilitate the specification of infrared detector diodes, particularly in conjunction with the preparation of data for JEDEC type registration. Committee(s): JC-COUN Free download. Registration or login required.
PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS: Status: ReaffirmedSeptember 1981, April 1999	JEP69-B	Nov 1973
This publication indicates preferred pinouts for FETs in various package designs. Committee(s): JC-25 Free download. Registration or login required.
THERMAL RESISTANCE AND THERMAL IMPEDANCE TEST METHODS FOR STUD AND BASE-MOUNTED RECTIFIER DIODES AND THYRISTORS Status: Rescinded	JEP88	Jan 1974
Committee(s): JC-22.1
MICROELECTRONIC DEVICE TYPE ASSIGNMENTS Status: RescindedJun-92	JEP93	Jan 1975
Committee(s): JCJEDC
RECOMMENDED PRACTICE FOR DUAL DIMENSIONING Status: Rescinded	JEP86-A	Jan 1976
Committee(s): JC-11
GUIDELINES FOR NONDESTRUCTIVE PULL TESTING OF WIRE BONDS ON HYBRID DEVICES Status: Rescinded	JEP96	Jan 1977
Committee(s): JC-13.5
GLOSSARY OF MICROELECTRONIC TERMS, DEFINITIONS, AND SYMBOLS: ELEVATED TO JESD99, June 1985. Status: Rescinded	JEP99	Jul 1977
Committee(s): JC-10 Free download. Registration or login required.
STANDARD FOR 64K x 1 DYNAMIC RAM - SUPERSEDED BY JESD21-C. Status: RescindedApr-85	JEP102	Jan 1978
Committee(s): JC-42
TERMS, DEFINTIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS AND MEMORY INTEGRATED CIRCUITS: ELEVATED TO JESD100, August 1993. Status: Rescinded	JEP100	Sep 1979
Committee(s): JC-10 Free download. Registration or login required.
JEDEC GUIDELINE FOR THE CHARACTERIZATION OF HYBRID POLYMERIC MATERIALS - SUPERSEDED BY JESD72, June 2001 Status: Rescinded	JEP105	Apr 1983
Committee(s): JC-13.5 Free download. Registration or login required.
THERMAL RESISTANCE FOR TEST METHODS FOR SIGNAL DIODES - SUPERSEDED BY EIA-531, July 1986. See JESD531, April 2002. Status: Rescinded	JEP90	Sep 1983
Committee(s): JC-22.4 Free download. Registration or login required.
LETTER SYMBOLS USED WITH INFRARED DEVICES - INCORPORATED INTO JESD77-A. Status: Rescinded	JEP75	Aug 1984
Committee(s): JC-10 Free download. Registration or login required.
TEST METHOD FOR QUALIFICATION AND ACCEPTANCE OF PARTICLE GETTERS FOR USE IN HYBRID MICROELECTRONIC APPLICATIONS - SUPERSEDED BY JESD72, June 2001 Status: Rescinded	JEP107	Apr 1985
Committee(s): JC-13.5 Free download. Registration or login required.
TEST PROCEDURES FOR CUSTOM MONOLITHIC MICROCIRCUITS - SUPERSEDED BY MIL-PRF-38535C. Status: RescindedJun-96	JEP111	Jan 1986
Committee(s): JC-13, JC-13.2
SOLID STATE PRODUCTS REGISTRATION LIST(ORDER FROM TYPE ADMINISTRATION OFFICE) Status: ReaffirmedNovember 2002	JEP64	Jan 1986
This publication includes addenda from 1976 to August 1986. The purpose of this list is to determine release numbers (file numbers) for JEDEC Type Designations. (See page 6 for more information.) Committee(s): JCJEDC
TEST METHOD FOR QUALIFICATION AND ACCEPTANCE OF CIRCUIT SUPPORT FILMS FOR USE IN MICROELECTRONIC APPLICATIONS - SUPERSEDED BY JESD72, June 2001 Status: Rescinded	JEP112	Jun 1987
Committee(s): JC-13 Free download. Registration or login required.
GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS:	JEP110	Jul 1988
This publication is intended for power GaAs FET applications requiring high reliability. An accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FETs operating temperature so that more accurate life estimates can be made. FET failure mechanisms and failure rates have, in general, an exponential dependence on temperature (which is why temperature-accelerated testing is successful). Because of the exponential relationship of failure rate with temperature, the thermal resistance should be referenced to the hottest part of the FET. Committee(s): JC-14.7 Free download. Registration or login required.

Standards & Documents Search

TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS:

STANDARD LIST OF VALUES TO BE USED IN POWER TRANSISTOR DEVICE REGISTRATION AND MINIMUM DIFFERENCES FOR DISCRETENESS OF REGISTRATIONS - SUPERSEDED BY EIA-419-A, February 1996.

LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS:

RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS:

PREFERRED LEAD CONFIGURATION FOR FIELD-EFFECT TRANSISTORS:

THERMAL RESISTANCE AND THERMAL IMPEDANCE TEST METHODS FOR STUD AND BASE-MOUNTED RECTIFIER DIODES AND THYRISTORS

MICROELECTRONIC DEVICE TYPE ASSIGNMENTS

RECOMMENDED PRACTICE FOR DUAL DIMENSIONING

GUIDELINES FOR NONDESTRUCTIVE PULL TESTING OF WIRE BONDS ON HYBRID DEVICES

GLOSSARY OF MICROELECTRONIC TERMS, DEFINITIONS, AND SYMBOLS: ELEVATED TO JESD99, June 1985.

STANDARD FOR 64K x 1 DYNAMIC RAM - SUPERSEDED BY JESD21-C.

TERMS, DEFINTIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS AND MEMORY INTEGRATED CIRCUITS: ELEVATED TO JESD100, August 1993.

JEDEC GUIDELINE FOR THE CHARACTERIZATION OF HYBRID POLYMERIC MATERIALS - SUPERSEDED BY JESD72, June 2001

THERMAL RESISTANCE FOR TEST METHODS FOR SIGNAL DIODES - SUPERSEDED BY EIA-531, July 1986. See JESD531, April 2002.

LETTER SYMBOLS USED WITH INFRARED DEVICES - INCORPORATED INTO JESD77-A.

TEST METHOD FOR QUALIFICATION AND ACCEPTANCE OF PARTICLE GETTERS FOR USE IN HYBRID MICROELECTRONIC APPLICATIONS - SUPERSEDED BY JESD72, June 2001

TEST PROCEDURES FOR CUSTOM MONOLITHIC MICROCIRCUITS - SUPERSEDED BY MIL-PRF-38535C.

SOLID STATE PRODUCTS REGISTRATION LIST(ORDER FROM TYPE ADMINISTRATION OFFICE)

TEST METHOD FOR QUALIFICATION AND ACCEPTANCE OF CIRCUIT SUPPORT FILMS FOR USE IN MICROELECTRONIC APPLICATIONS - SUPERSEDED BY JESD72, June 2001

GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS:

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