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Title	Document #	Date
PART MODEL SCHEMAS	JEP30-10v6-0-0	Aug 2024
This download includes all files under the parent schema JEP30-10v6-0-0 (Committees: JC-11, JC-11.2) including: JEP30-A101v2-0-3 (Assembly Process), Committees: JC-11, JC-11.2, JC-14 JEP30-E101v4-0-0 (Electrical), Committees: JC-11, JC-11.2, JC-16 JEP30-P101v6-0-0 (Package), Committees: JC-11, JC-11.2 JEP30-S101v1-0-3 (Supply Chain), Committees: JC-11, JC-11.2, JC-14 JEP30-T101v2-0-3 (Thermal) Committees: JC-11, JC-11.2, JC-15 JEP30-D10v4-0-1 (Types Dictionary) Committees: JC-11, JC-11.2 This will enable the user to validate the schemas. For more information visit the main JEP30 webpage. Committee(s): JC-11, JC-11.2, JC-14, JC-15, JC-16 Free download. Registration or login required.
Test Methods for Switching Energy Loss Associated with Output Capacitance Hysteresis in Semiconductor Power Devices Volume 1	JEP200	Jun 2024
This document provides guidelines for test methods and circuits to be used for measuring switching energy loss due to output capacitance hysteresis in semiconductor power devices. Committee(s): JC-70, JC-70.1, JC-70.2 Free download. Registration or login required.
Guidelines for Reverse Recovery Time and Charge Measurement of SiC MOSFET Version 1.0	JEP201	Aug 2024
This guideline is intended to overcome the limitations of prior standards and provide a test circuit and method that provides both reliable and repeatable results. Committee(s): JC-70, JC-70.2 Free download. Registration or login required.

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