Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # | Date |
|---|---|---|
DDR2 SPD INTERPRETATION OF TEMPERATURE RANGE AND (SELF-) REFRESH OPERATION |
JEP179 | Jun 2006 |
The purpose of this document is to explain the meaning of SPD setting (JESD21 SPD section) for DDR2 SDRAM (JESD79-2) in normal and extended temperature operationy67. Committee(s): JC-42.3 Free download. Registration or login required. |
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RELATIVE SPECTRAL RESPONSE CURVES FOR SEMICONDUCTOR INFRARED DETECTORS: |
JEP78 | Oct 1969 |
The intent of this publication is to facilitate the specification of infrared detector diodes, particularly in conjunction with the preparation of data for JEDEC type registration. Committee(s): JC-COUN Free download. Registration or login required. |
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STANDARD LIST OF VALUES TO BE USED IN POWER TRANSISTOR DEVICE REGISTRATION AND MINIMUM DIFFERENCES FOR DISCRETENESS OF REGISTRATIONS - SUPERSEDED BY EIA-419-A, February 1996.Status: Rescinded |
JEP74 | Jan 1969 |
Committee(s): JC-25 |
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FORWARD TURN-ON TIME MEASUREMENT ON SEMI-DIODES - INCORPORATED INTO EIA-282-A.Status: Rescinded |
JEP87 | Jan 1992 |
Committee(s): JC-22.2 |
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STANDARD FOR 64K x 1 DYNAMIC RAM - SUPERSEDED BY JESD21-C.Status: RescindedApr-85 |
JEP102 | Jan 1978 |
Committee(s): JC-42 |
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