Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD |
JEP152 | May 2007 |
This document is the work product of the JC-45.1 DDR2 DIMM Clock Skew Measurement task group.The purpose of this document is to define procedures to measure clock parameters on registered DIMMs using the DDR2 Clock Reference Board. It is NOT the intent of this document to set specification values or validation requirements. Free download. Registration or login required. |
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TERMS, DEFINTIONS, AND LETTER SYMBOLS FOR MICROCOMPUTERS AND MEMORY INTEGRATED CIRCUITS: ELEVATED TO JESD100, August 1993.Status: Rescinded |
JEP100 | Sep 1979 |
Committee(s): JC-10 Free download. Registration or login required. |
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SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERSStatus: ReaffirmedNovember 1999, May 2003 |
JEP103A | Jul 1996 |
In order to improve understanding between manufacturers and users, a consistent set of product-documentation classifications associated with the stages of product development. Committee(s): JC-10 Free download. Registration or login required. |
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JEDEC GUIDELINE FOR THE CHARACTERIZATION OF HYBRID POLYMERIC MATERIALS - SUPERSEDED BY JESD72, June 2001Status: Rescinded |
JEP105 | Apr 1983 |
Committee(s): JC-13.5 Free download. Registration or login required. |
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TEST METHOD FOR QUALIFICATION AND ACCEPTANCE OF PARTICLE GETTERS FOR USE IN HYBRID MICROELECTRONIC APPLICATIONS - SUPERSEDED BY JESD72, June 2001Status: Rescinded |
JEP107 | Apr 1985 |
Committee(s): JC-13.5 Free download. Registration or login required. |