Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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LIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS: |
JEP79 | Sep 1969 |
This publication is for photoconductive cells sensitive primarily in the visible and near infrared region. Free download. Registration or login required. |
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STANDARD LIST OF VALUES TO BE USED IN POWER TRANSISTOR DEVICE REGISTRATION AND MINIMUM DIFFERENCES FOR DISCRETENESS OF REGISTRATIONS - SUPERSEDED BY EIA-419-A, February 1996.Status: Rescinded |
JEP74 | Jan 1969 |
Committee(s): JC-25 |
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TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS:Status: ReaffirmedSeptember 1981, April 1999 |
JEP65 | Dec 1967 |
This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data. Committee(s): JC-25 Free download. Registration or login required. |
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