Global Standards for the Microelectronics Industry
Standards & Documents Search
Title |
Document # | Date |
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AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS |
JESD210A | Mar 2017 |
This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD. Committee(s): JC-22.2, JC-22.5 Free download. Registration or login required. |
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Backup Energy Module Standard for NVDIMM Memory Devices (BEM) |
JESD315 | Dec 2021 |
This standard defines the functional requirements of Backup Energy Module (BEM), henceforth referred to as BEM in this standard. This module shall be used to provide backup power to the Industry Defined Storage Array Controller Cards and NVDIMM-n as applicable. All standards are applicable under all operating conditions unless otherwise stated. Item 2279.03 Committee(s): JC-45 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUT FOR 1-, 2-, AND 3-BIT LOGIC FUNCTIONS: |
JESD75-4 | Mar 2004 |
This standard defines device pinout for 1-, 2- and 3-bit wide logic functions. This pinout specifically applies to the conversion of Dual-Inline-Packaged (DIP) 1-, 2- and 3-bit logic devices to DSBGA-packaged 1-, 2- and 3-bit logic devices. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16, 18, AND 20-BIT LOGIC FUNCTIONS USING A 54 BALL PACKAGE: |
JESD75-1 | Oct 2001 |
This standard establishes a 54 Ball Grid Array pinout for 16, 18 and 20-bit standard logic devices that are currently being produced in 48 and 56 Pin SSOP and TSSOP packages. The 54 Ball Grid Array Package is organized as a 6 x 9 array with balls on a .8mm x .8mm grid pitch. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 16-BIT LOGIC FUNCTIONS: |
JESD75-2 | Jul 2001 |
This standard provides a pinout standard for 16-bit wide logic devices offered in a 56-ball areagrid array package to provide for uniformity, multiplicity of sources, elimination of confusion,ease of device specification, and ease of use. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 32-BIT LOGIC FUNCTIONS: |
JESD75 | Nov 1999 |
The purpose of this standard is to provide a pinout standard for dual-die 32-bit logic devices offered in a 96- and 144-ball grid array package for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease use. This standard defines device output for 32-bit wide buffer, driver and transceiver functions. This pinout specifically applies to the conversion of DIP-packaged 16-bit logic devices to LFBGA-packaged dual-die 32-bit logic devices. Committee(s): JC-40 Free download. Registration or login required. |
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BALL GRID ARRAY PINOUTS STANDARDIZED FOR 8-BIT LOGIC FUNCTIONS: |
JESD75-3 | Jul 2001 |
This standard provides a pinout standard for 8-bit logic devices offered in a 20-ball area gridarray package to provide for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Committee(s): JC-40 Free download. Registration or login required. |
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BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICs FOR HANDHELD ELECTRONIC PRODUCTS |
JESD22-B113B | Aug 2018 |
The Board Level Cyclic Bend Test Method is intended to evaluate and compare the performance of surface mount electronic components in an accelerated test environment for handheld electronic products applications. The purpose is to standardize the test methodology to provide a reproducible performance assessment of surface mounted components while duplicating the failure modes normally observed during product level test. This is not a component qualification test and is not meant to replace any product level test that may be needed to qualify a specific product and assembly. Free download. Registration or login required. |
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Board Level Drop Test Method of Components for Handheld Electronic Products |
JESD22-B111A.01 | Jun 2024 |
This Test Method standardizes the test board and test methodology to provide a reproducible assessment of the drop test performance of surface mounted components. Free download. Registration or login required. |
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BOND WIRE MODELING STANDARD: |
JESD59 | Jun 1997 |
This standard describes the modeling of a bond wire from an integrated circuit (IC) die to a package lead in a ball or wedge type wire bond configuration. Committee(s): JC-15.2 Free download. Registration or login required. |
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BUS INTERCONNECT LOGIC (BIC) FOR 1.2 V |
JESD8-16A | Nov 2004 |
This standard defines the electrical parameters for high-speed interfaces for use in the 1.2V electrical environment. Included in the standard are a single ended signaling interface suitable for parallel buses, and a differential signaling interface suitable for clock applications or parallel differential buses. JEDEC BIC Standard JESD8-16A continues the tradition of the JESD8-xx standards, defining electrical interfaces for the industry as new technologies and bus requirements develop. Previously, JEDEC defined standard JESD8-6, the HSTL standard, for use in 1.5V electrical environments. BIC is similar to HSTL, except the power supply voltage has dropped from 1.5V to 1.2V, and interface requirements are tightened to allow much higher speeds Committee(s): JC-16 Free download. Registration or login required. |
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BYTE ADDRESSABLE ENERGY BACKED INTERFACE |
JESD245E | Apr 2022 |
This standard specifies the host and device interface for a DDR4 NVDIMM-N, which is a DIMM that achieves non-volatility by copying SDRAM contents into non-volatile memory (NVM) when host power is lost using an Energy Source managed by either the module or the host. This standard is used in conjunction with JESD248. Item 2233.54G Committee(s): JC-45.6 Free download. Registration or login required. |
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CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES - SUPERSEDED BY JESD9B, May 2011.Status: Rescinded, May 2011 |
JESD27 | Aug 1993 |
The intent of this standard is to be a guide in the manufacture and procurement of ceramic packages, especially for the hybrid industry. Manufacturers or ceramic packages and procuring activities for these packages will now be able to use this document as the means for agreement in the imposition of minimum requirements in qualification, screening, and quality conformance. Free download. Registration or login required. |
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CHIP CARRIER PINOUTS STANDARDIZED FOR CMOS 4000, HC AND HCT SERIES OF LOGIC CIRCUITS: |
JESD11 | Dec 1984 |
This standard indicates the procedures used to convert existing DIP and flat packages for digital parts (SSI & MSI) to chip carrier packages. Committee(s): JC-40.2 Free download. Registration or login required. |
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COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICESStatus: Reaffirmed November 1999, September 2009 |
JESD236-C | Mar 1986 |
This standard details the methods to be followed if color coding is used to identify JEDEC-assigned type numbers or for cathode identification of discrete semiconductor devices. Formerly known as EIA-236-C and/or ANSI/EIA-236-C-1986 (1995). Committee(s): JC-10 Free download. Registration or login required. |
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COMMON FLASH INTERFACE (CFI): |
JESD68.01 | Sep 2003 |
The Common Flash Interface (CFI) specification outlines a device and host system software interrogation handshake that allows specific software algorithms to be used for entire families of devices. This allows device-independent, JEDEC ID-independent, and forward- and backward-compatible software support for the specific flash families. It allows flash vendors to standardize their existing interfaces for long-term compatibility. The changes for this minor revision are indicated in Annex A on page 11. Committee(s): JC-42.4 Free download. Registration or login required. |
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COMPACT THERMAL MODEL OVERVIEW |
JESD15-1.01 | Mar 2023 |
Terminology update. This document should be used in conjunction with the parent document, and is intended to function as an overview to support the effective use of Compact Thermal Model (CTM) methodologies as specified in the companion methods documents. Free download. Registration or login required. |
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COMPONENT PROBLEM ANALYSIS AND CORRECTIVE ACTION REQUIREMENTS - SUPERSEDED BY EIA-671, November 1996.Status: Superseded |
JESD43 | Nov 1996 |
Committee(s): JC-14.4 Free download. Registration or login required. |
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Compression Attached Memory Module (CAMM2) Common Standard |
JESD318A Ver. 1.10 | Nov 2024 |
This standard defines the electrical and mechanical requirements for Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (DDR5 SDRAM CAMM2s) and Low Power Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (LP5 SDRAM CAMM2s). Committee(s): JC-45 Free download. Registration or login required. |
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CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS:Status: ReaffirmedApril 1999, April 2002 (Original publication July 1965) |
JESD320-A | Dec 1992 |
This standard provides guidance for achieving equilibrium when measuring temperature sensitive static parameters of signal diodes. Formerly known as EIA-320-A. Committee(s): JC-22.4 Free download. Registration or login required. |
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