Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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Automotive Solid State Drive (SSD) Device StandardRelease Number: 1.1 |
JESD312 | Jan 2025 |
This standard defines the specifications of interface parameters, signaling protocols, environmental requirements, packaging, and other features for a solid state drive (SSD) targeted primarily at automotive applications. Free download. Registration or login required. |
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Universal Flash Storage (UFS)Release Number: Version 4.1 |
JESD220G | Dec 2024 |
This document replaces all prior versions; however, JESD220F August 2022 (version 4.0) remains available for reference purposes. This standard defines a UFS Universal Flash Storage electrical interface and a UFS memory device. Available for purchase: $423.00 Add to Cart Paying JEDEC Members may login for free access. |
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Universal Flash Storage Host Controller Interface (UFSHCI)Release Number: Version 4.1 |
JESD223F | Dec 2024 |
This document replaces all prior versions; however, JESD223E August 2022 (version 4.0) remains available for reference purposes. This standard describes a functional specification of the Host Controller Interface (HCI) for Universal Flash Storage (UFS). The objective of UFSHCI is to provide a uniform interface method of accessing the UFS hardware capabilities so that a standard/common Driver can be provided for the Host Controller. The common Driver would work with UFS host controller from any vendor. This standard includes a description of the hardware/software interface between system software and the host controller hardware. It is intended for hardware designers, system builders and software developers. This standard is a companion document to [UFS], Universal Flash Storage (UFS). The reader is assumed to be familiar with [UFS], [MIPI-UNIPRO], and [MIPI-M-PHY]. Clause 4 provides a brief overview of the architectural overview of UFS. Clause 5 describes the register interface of UFSHCI. Clause 6 describes the data structure used by UFSHCI. Clause 7 provides a theory of operation for UFSHCI. Clause 8 describes the error recovery process for UFSHCI. Available for purchase: $220.00 Add to Cart Paying JEDEC Members may login for free access. |
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DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card C AnnexRelease Number: Version 1.00 |
JESD323-A0-RCC | Dec 2024 |
This standard, “JESD323-A0-RCC, “DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card C Annex” defines the design detail of x16, 1 Package Ranks DDR5 Clocked UDIMM. Free download. Registration or login required. |
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DDR5 DIMM Labels |
JESD401-5C | Nov 2024 |
This standard defines the labels that shall be applied to all DDR5 memory modules to fully describe the key attributes of the module. The label can be in the form of a stick-on label, silk screened onto the assembly, or marked using an alternate customer-readable format. A readable point size should be used, and the number can be printed in one or more rows on the label. Hyphens may be dropped when lines are split, or when font changes sufficiently. Committee(s): JC-45 Free download. Registration or login required. |
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Compression Attached Memory Module (CAMM2) Common Standard |
JESD318A Ver. 1.10 | Nov 2024 |
This standard defines the electrical and mechanical requirements for Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (DDR5 SDRAM CAMM2s) and Low Power Double Data Rate, Synchronous DRAM Compression-Attached Memory Modules (LP5 SDRAM CAMM2s). Committee(s): JC-45 Free download. Registration or login required. |
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LPDDR5/5X Compression Attached Memory Module (CAMM2) Raw Card E AnnexRelease Number: Version 1.00 |
JESD318-F0-RCE | Nov 2024 |
This standard, JESD318-F0-RCE, “LPDDR5/5X Compression Attached Memory Module (CAMM2) Raw Card E Annex”, defines the design detail of eight x16 subchannels from four 315-ball dual channel LPDDR5/5x devices. Committee(s): JC-45 Free download. Registration or login required. |
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DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card A AnnexRelease Number: Version 1.00 |
JESD323-A0-RCA | Nov 2024 |
This standard, JESD323-A0-RCA, “DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card A Annex” defines the design detail of x8, 1 Package Rank DDR5 NECC CUDIMM with Clock Driver. |
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DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card A AnnexRelease Number: Version 1.00 |
JESD323-A0-RCA | Nov 2024 |
This standard, JESD323-A0-RCA, “DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Raw Card A Annex” defines the design detail of x8, 1 Package Rank DDR5 NECC CUDIMM with Clock Driver. Free download. Registration or login required. |
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DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) Raw Card A AnnexRelease Number: Version 1.00 |
JESD324-V0-RCA | Nov 2024 |
This standard, JESD324-V0-RCA, “DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) Raw Card A Annex” defines the design detail of x8, 1 Package Ranks DDR5 CSODIMM with Clock Driver. Free download. Registration or login required. |
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DDR5 Clocked Unbuffered Dual Inline Memory Module with 4-bit ECCRelease Number: Version 1.00 |
JESD323-B4-RCD | Nov 2024 |
This standard, JESD323-B4-RCD, “DDR5 Clocked Unbuffered Dual Inline Memory Module with 4-bit ECC (EC4 CUDIMM) Raw Card D Annex” defines the design detail of x8, 1 Package Rank DDR5 ECC CUDIMM with Clock Driver. Free download. Registration or login required. |
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Descriptive Designation System for Electronic-device Packages and Footprints |
JESD30N | Nov 2024 |
This standard establishes requirements for the generation of electronic-device package designators for JEDEC. Free download. Registration or login required. |
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DDR5 Clocked Small Outline Dual Inline Memory Module with 4-bit ECC (EC4 CSODIMM) Raw Card D AnnexRelease Number: Version 1.00 |
JESD324-W4-RCD | Nov 2024 |
This standard, JESD324-W4-RCD, “DDR5 Clocked Small Outline Dual Inline Memory Module with 4-bit ECC (EC4 CSODIMM) Raw Card D Annex” defines the design detail of x8, 1 Package Ranks DDR5 CSODIMM with Clock Driver. Committee(s): JC-45.3 Free download. Registration or login required. |
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DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) Raw Card C AnnexRelease Number: Version 1.00 |
JESD324-V0-RCC | Nov 2024 |
This standard, JESD324-V0-RCC, "DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) RawCard C Annex" defines the design detail of x16, 1 Package Ranks DDR5 CSODIMM with Clock Driver. Committee(s): JC-45.3 Free download. Registration or login required. |
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Serial Flash Discoverable Parameters (SFDP) |
JESD216G | Nov 2024 |
The SFDP standard defines the structure of the SFDP database within the memory device and methods used to read its data. Committee(s): JC-42.4 Free download. Registration or login required. |
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LPDDR5/5X Serial Presence Detect (SPD) ContentsRelease Number: 1.0 |
JESD406-5A | Nov 2024 |
This publication describes the serial presence detect (SPD) values for all LPDDR5/5X memory modules. In this context, “modules” applies to memory modules like traditional Dual In-line Memory Modules (DIMMs) or solder-down motherboard applications. The SPD data provides critical information about all modules on the memory channel and is intended to be use by the system's BIOS in order to properly initialize and optimize the system memory channels. The storage capacity of the SPD non-volatile memory is limited, so a number of techniques are employed to optimize the use of these bytes, including overlays and run length limited coding. Committee(s): JC-45 Free download. Registration or login required. |
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Low Power Double Data Rate Interface for Non-Volatile Memory (LPDDR4X-NVM) Standard |
JESD326-4 | Nov 2024 |
This standard defines the Low Power Double Data Rate interface for Non-Volatile Memory (LPDDR4XNVM) Standard. This standard describes features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this specification is to define the minimum set of requirements for a JEDEC compliant 16 bit single channel LPDDR4X-NVM device. LPDDR4X-NVM density ranges from 128Mb through 32Gb. Free download. Registration or login required. |
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NAND Flash Interface Interoperability |
JESD230G | Oct 2024 |
This standard was jointly developed by JEDEC and the Open NAND Flash Interface Workgroup, hereafter referred to as ONFI. This standard defines a standard NAND flash device interface interoperability standard that provides means for system be designed that can support Asynchronous SDR, Synchronous DDR and Toggle DDR NAND flash devices that are interoperable between JEDEC and ONFI member implementations. Free download. Registration or login required. |
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Graphics Double Data Rate 7 SGRAM Standard (GDDR7) |
JESD239A | Sep 2024 |
This standard defines the Graphics Double Data Rate 7 (GDDR7) Synchronous Graphics Random Access Memory (SGRAM) specification, including features, functionality, package, and pin assignments.
Free download. Registration or login required. |
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Wire Bond Pull Test Methods |
JESD22-B120.01 | Sep 2024 |
This test method provides a means for determining the strength and failure mode of a wire bonded to, and the corresponding interconnects on, a die or package bonding surface and may be performed on pre-encapsulation or post-encapsulation devices. Free download. Registration or login required. |
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JEDEC® Memory Controller Standard – for Compute Express Link® (CXL®) |
JESD319 | Sep 2024 |
This standard defines the overall specifications, interface parameters, signaling protocols, and features for a CXL® Memory Controller ASIC. The standard includes pinout information, functional description, and configuration interface. This standard, along with other Referenced Specifications, should be treated as a whole for the purposes of defining overall functionality for CXL® Memory Controller (referred to as CMC). Committee(s): JC-40 Free download. Registration or login required. |
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Temperature Range and Measurement Standards for Components and Modules |
JESD402-1B | Sep 2024 |
This document specifies standard temperature ranges that may be used, by way of referencing JESD402-1, in other standards, specifications, and datasheets when defining temperature related specifications. Committee(s): JC-42 Free download. Registration or login required. |
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JEDEC® Memory Device Management Standard – for Compute Express Link® (CXL®) |
JESD325 | Sep 2024 |
This standard provides a reference specification for systems and device management capabilities found in CXL memory devices. It is intended to target, but may not be limited to, CXL memory FRUs that are based on PCIe Gen 5 and compliant to the CXL 2.0 Specification or later. Free download. Registration or login required. |
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DDR5 SERIAL PRESENCE DETECT (SPD) CONTENTSRelease Number: Release 1.3 |
JESD400-5C | Sep 2024 |
This standard describes the serial presence detect (SPD) values for all DDR5 memory modules. In this context, “modules” applies to memory modules like traditional Dual In-line Memory Modules (DIMMs) or solder-down motherboard applications. The SPD data provides critical information about all modules on the memory channel and is intended to be use by the system's BIOS in order to properly initialize and optimize the system memory channels. Committee(s): JC-45 Free download. Registration or login required. |
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SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD |
JESD218B.03 | Aug 2024 |
Terminology Update, see Annex. This standard defines JEDEC requirements for solid state drives. For each defined class of solid state drive, the standard defines the conditions of use and the corresponding endurance verification requirements. Although endurance is to be rated based upon the standard conditions of use for the class, the standard also sets out requirements for possible additional use conditions as agreed to between manufacturer and purchaser. Revision A includes further information on SSD Capacity. Items 303.19, 303.20, 303.21, 303.22, 303.23, 303.26, 303.27, 303.28, and 303.32 Committee(s): JC-64.8 Available for purchase: $76.00 Add to Cart Paying JEDEC Members may login for free access. |
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JEDEC Module Sideband Bus (SidebandBus) |
JESD403-1C.01 | Aug 2024 |
This standard defines the assumptions for the system management bus for next generation memory solutions; covering the interface protocol, use of hub devices, and voltages appropriate to these usages. Committee(s): JC-45 Free download. Registration or login required. |
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DDR5 SDRAMRelease Number: Version 1.31 |
JESD79-5C.01 | Jul 2024 |
Version 1.31 This standard defines the DDR5 SDRAM specification, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this Standard is to define the minimum set of requirements for JEDEC compliant 8 Gb through 32 Gb for x4, x8, and x16 DDR5 SDRAM devices. This standard was created based on the DDR4 standards (JESD79-4) and some aspects of the DDR, DDR2, DDR3, and LPDDR4 standards (JESD79, JESD79-2, JESD79-3, and JESD209-4). Available for purchase: $423.00 Add to Cart Paying JEDEC Members may login for free access. |
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JEDEC® Memory Module Label – for Compute Express Link® (CXL®)Release Number: 1.1 |
JESD405-1B | Jun 2024 |
This standard defines the labels that shall be applied to all CXL memory modules to fully describe the key attributes of the module. The label can be in the form of a stick-on label, silk screened onto the assembly, or marked using an alternate customer-readable format. Committee(s): JC-45 Free download. Registration or login required. |
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Information Requirements for the Qualification of Solid State Devices |
JESD69D | Jun 2024 |
This standard defines the requirements for the device qualification package, which the supplier provides to the customer. Free download. Registration or login required. |
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Board Level Drop Test Method of Components for Handheld Electronic Products |
JESD22-B111A.01 | Jun 2024 |
This Test Method standardizes the test board and test methodology to provide a reproducible assessment of the drop test performance of surface mounted components. Free download. Registration or login required. |
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Low Power Double Data Rate 4 (LPDDR4) |
JESD209-4E | Jun 2024 |
This document defines the LPDDR4 standard, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this specification is to define the minimum set of requirements for a JEDEC compliant 16 bit per channel SDRAM device with either one or two channels. LPDDR4 dual channel device density ranges from 2 Gb through 32 Gb and single channel density ranges from 1 Gb through 16 Gb. Available for purchase: $374.00 Add to Cart Paying JEDEC Members may login for free access. |
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DDR5 Registering Clock Driver Definition (DDR5RCD04) |
JESD82-514.01 | Jun 2024 |
This document defines standard specifications of DC interface parameters, switching parameters, and test loading for definition of the DDR5 Registering Clock Driver (RCD) with parity for driving address and control nets on DDR5 RDIMM applications. The DDR5RCD04 Device ID is DID = 0x0054. Free download. Registration or login required. |
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PMIC5020 Power Management IC StandardRelease Number: Version 1.0.1 |
JESD301-4 | Apr 2024 |
This standard defines the specifications of interface parameters, signaling protocols, and features for PMIC device as used for memory module applications. The designation PMIC5020 refers to the device specified by this document. The purpose is to provide a standard for the PMIC5020 device for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Free download. Registration or login required. |
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Gate Dielectric Breakdown |
JESD263 | Mar 2024 |
This document describes procedures developed for estimating the overall integrity of gate dielectrics. JESD263 supersedes these other 4 standards: JESD35A, JESD35-1 ADDENDUM, JESD35-2 and JESD92. Free download. Registration or login required. |
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JEDEC® Memory Module Reference Base Standard – for Compute Express Link® (CXL®) |
JESD317A | Mar 2024 |
This standard defines the specifications of interface parameters, signaling protocols, environmental requirements, packaging, and other features as reference for specific target implementations of CXL-attached memory modules. Committee(s): JC-45 Free download. Registration or login required. |
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SPI Safety Extensions (CRC) for Non Volatile SPI Flash Memories (QPI and xSPI) |
JESD255 | Mar 2024 |
The JESD255 document defines CRC modes supported with 8-bit aligned and 16-bit aligned data transactions. It is limited to logical bus transactions and does not cover the electrical properties of the IO bus. Free download. Registration or login required. |
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Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices |
JESD625C.01 | Mar 2024 |
This standard applies to devices susceptible to damage by electrostatic discharge greater than 100 volts human body model (HBM) and 200 volts charged device model (CDM). Free download. Registration or login required. |
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DDR5 Clock Driver Definition (DDR5CKD01)Release Number: Version 1.1 |
JESD82-531A.01 | Feb 2024 |
This document defines standard specifications of DC interface parameters, switching parameters, and test loading for definition of the DDR5 Clock Driver (CKD) for re-driving the DCK for CUDIMM, CSODIMM and CAMM applications. The DDR5CKD01 Device ID is DID = 0x0531. (5 = DDR5, Free download. Registration or login required. |
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DDR5 Unbuffered Dual Inline Memory Module (UDIMM) Common StandardRelease Number: Version 1.1 |
JESD308A | Jan 2024 |
This standard defines the electrical and mechanical requirements for 288-pin, 1.1 V (VDD), Unbuffered, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR5 SDRAM UDIMMs). These DDR5 Unbuffered DIMMs (UDIMMs) are intended for use as main memory when installed in Computers. Free download. Registration or login required. |
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DDR5 Clocked Unbuffered Dual Inline Memory Module (CUDIMM) Common SpecificationRelease Number: Version 1.0 |
JESD323 | Jan 2024 |
This standard defines the electrical and mechanical requirements for 288-pin, 1.1 V (VDD), Clocked, Unbuffered, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR5 SDRAM CUDIMMs). These DDR5 Clocked Unbuffered DIMMs (CUDIMMs) are intended for use as main memory when installed in Computers. Free download. Registration or login required. |
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DDR5 Clocked Small Outline Dual Inline Memory Module (CSODIMM) Common SpecificationRelease Number: Version 1.0 |
JESD324 | Jan 2024 |
This standard defines the electrical and mechanical requirements for 262-pin, 1.1 V (VDD), Clocked Small Outline, Double Data Rate, Synchronous DRAM Dual In-Line Memory Modules (DDR5 SDRAM CSODIMMs). These DDR5 CSODIMMs are intended for use as main memory when installed in Computers, laptops and other systems. Free download. Registration or login required. |
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Serial Interface for Data Converters |
JESD204D | Dec 2023 |
This standard describes a serialized interface between data converters and logic devices. It contains normative information to enable designers to implement devices that communicate with other devices covered by this specification. Informative annexes are included to clarify and exemplify the document. Committee(s): JC-16 Free download. Registration or login required. |
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XFM Device, Version 2.0 |
JESD233A | Dec 2023 |
This standard specifies the mechanical and electrical characteristics of the XFM removable memory Device. Patents(): A complete list of Assurance/Disclosure Forms is available to JEDEC members in the Members Area. Non-members can obtain individual Assurance/Disclosure Forms on request from the JEDEC office. Free download. Registration or login required. |
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Power Cycling |
JESD22-A122B | Nov 2023 |
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. Free download. Registration or login required. |
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Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature |
JESD22-B112C | Nov 2023 |
This test method is to measure the deviation from uniform flatness of an integrated circuit package body for the range of thermal conditions experienced during the surface-mount soldering operation. Free download. Registration or login required. |
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IC LATCH-UP TEST |
JESD78F.02 | Nov 2023 |
This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined latch-up stress. This standard has been adopted by the Defense Logistics Agency (DLA) as project 5962-1880. Free download. Registration or login required. |
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Test Method for Total Ionizing Dose (TID) from X-ray Exposure in Terrestrial Applications |
JESD22-B121 | Nov 2023 |
This test method covers X-ray imaging for terrestrial applications on packaged devices. Free download. Registration or login required. |
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Zoned Storage for UFS |
JESD220-5 | Nov 2023 |
The purpose of this standard is to describe Zoned Storage for UFS, which enables higher bandwidth, lower latency and to reduce write amplification. Patents(): Huawei 201911209032.1; 116166570,A Memory Technologies LLC 101952808 104657284 2248023 3493067 602009056490.0 602009064847.0 HK1210296 5663720 6602823 10-1281326 10-1468824 2248023 3493067 2248023 3493067 8307180 8601228 9063850 9367486 10540094 11550476 Free download. Registration or login required. |
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Universal Flash Storage (UFS) File Based Optimizations (FBO) Extension |
JESD220-4 Version 1.01 | Nov 2023 |
This standard specifies the extension specification of the UFS electrical interface and the memory device. PLEASE NOTE: Revision and renumbering of JESD231 Version 1.0, August 2022 Free download. Registration or login required. |
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PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD) |
JESD49B.01 | Oct 2023 |
This standard facilitates the procurement and use of semiconductor die products provided in bare or bumped die form, and provides requirements and guidance to die suppliers as to the levels of as-delivered performance, quality and reliability expected. It also reflects the special needs of die product customers in terms of design and application data. Committee(s): JC-13 Free download. Registration or login required. |
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TS511X, TS521X Serial Bus Thermal Sensor Device Standard |
JESD302-1A | Aug 2023 |
This standard defines the specifications of interface parameters, signaling protocols, and features for fifth generation Temperature Sensor (TS5) as used for memory module applications. These device operate on I2C and I3C two-wire serial bus interface. The designation TS521X and TS511X refers to the device specified by this document. Committee(s): JC-40.1 Free download. Registration or login required. |
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LOW POWER DOUBLE DATA RATE (LPDDR) 5/5X |
JESD209-5C | Jul 2023 |
This document defines the LPDDR5/LPDDR5X standard, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this specification is to define the minimum set of requirements for a JEDEC compliant x16 one channel SDRAM device and x8 one channel SDRAM device. LPDDR5/LPDDR5X device density ranges from 2 Gb through 32 Gb. This document was created using aspects of the following standards: DDR2 (JESD79-2), DDR3 (JESD79-3), DDR4 (JESD79-4), LPDDR (JESD209), LPDDR2 (JESD209-2), LPDDR3 (JESD209-3), and LPDDR4 (JESD209-4). Available for purchase: $459.00 Add to Cart Paying JEDEC Members may login for free access. |
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Graphics Double Data Rate (GDDR6) SGRAM Standard |
JESD250D | May 2023 |
This document defines the Graphics Double Data Rate 6 (GDDR6) Synchronous Graphics Random Access Memory (SGRAM) specification, including features, functionality, package, and pin assignments. The purpose of this Standard is to define the minimum set of requirements for 8 Gb through 16 Gb x16 dual channel GDDR6 SGRAM devices. System designs based on the required aspects of this standard will be supported by all GDDR6 SGRAM vendors providing compatible devices. Some aspects of the GDDR6 standard such as AC timings and capacitance values were not standardized. Some features are optional and therefore may vary among vendors. In all cases, vendor data sheets should be consulted for specifics. This document was created based on some aspects of the GDDR5 Standard (JESD212). Committee(s): JC-42.3C Free download. Registration or login required. |
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Statistical Process Control Systems |
JESD557D | May 2023 |
This standard specifies the general requirements of a statistical process control (SPC) system. Committee(s): JC-14 Free download. Registration or login required. |
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HYBRIDS/MCM |
JESD93A | May 2023 |
This specification establishes the general requirements for hybrid microcircuits, RF/microwave hybrid microcircuits and MCMs (hereafter referred to as devices). Detailed performance requirements for a specific device are specified in the applicable device acquisition document. In the event of a conflict between this document and the device acquisition document, the device acquisition document will take precedence. Committee(s): JC-14.3 Free download. Registration or login required. |
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SPD5118 HUB and SERIAL PRESENCE DETECT DEVICE STANDARDRelease Number: Version 1.5.1 |
JESD300-5B.01 | May 2023 |
This standard defines the specifications of interface parameters, signaling protocols, and features for DDR5 Serial Presence Detect EEPROM with Hub function (SPD5 Hub) and integrated Temperature Sensor (TS) as used for memory module applications. The Hub feature allows isolation of a local bus from a Controller host bus. The designation SPD5118 or generic term SPD5 Hub refers to the devices specified by this standard. Committee(s): JC-40.1 Free download. Registration or login required. |
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DDR4 NVDIMM-N Design Standard |
JESD248A.01 | Apr 2023 |
Terminology update. This standard defines the electrical and mechanical requirements for 288-pin, 1.2 Volt (VDD), Double Data Rate, Synchronous SDRAM Non-Volatile Dual In-Line Memory Modules with NAND Flash backup (DDR4 NVDIMM-N). A DDR4 NVDIMM-N is a Hybrid Memory Module with a DDR4 DIMM interface consisting of DRAM that is made non-volatile through the use of NAND Flash. Committee(s): JC-45.6 Available for purchase: $123.36 Add to Cart Paying JEDEC Members may login for free access. |
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STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALSStatus: Reaffirmed 04/17/2023 |
JESD87 | Apr 2023 |
This document describes design of test structures needed to assess the reliability of aluminum-copper, refractory metal barrier interconnect systems. This includes any metal interconnect system where a refractory metal barrier or other barrier material prevents the flow of aluminum and/or copper metal ions from moving between interconnect layers. This document is not intended to show design of test structures to assess aluminum or aluminum-copper alloy systems, without barriers to Al and Cu ion movement, nor for Cu only metal systems. Some total interconnect systems might not include barrier materials on all metal layers. The structures in this standard are designed for cases where a barrier material separates two Al or Al alloy metal layers. The purpose of this document is to describe the design of test structures needed to assess electromigration (EM) and stress-induced-void (SIV) reliability of AlCu barrier metal systems. Committee(s): JC-14.2, JC-14.21 Free download. Registration or login required. |
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STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPERATURE:Status: Reaffirmed 4/17/23 |
JESD63 | Apr 2023 |
This method provides procedures to calculate sample estimates and their confidence intervals for the electromigration model parameters of current density and temperature. The model parameter for current density is the exponent (n) to which the current density is raised in Black's equation. The parameter for temperature is the activation energy for the electromigration failure process. Committee(s): JC-14.2 Free download. Registration or login required. |
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PMIC50x0 Power Management IC Standard |
JESD301-1A.02 Rev. 1.8.5 | Apr 2023 |
This standard defines the specifications of interface parameters, signaling protocols, and features for PMIC device as used for memory module applications. The designation PMIC5000, PMIC5010 refers to the device specified by this document. The purpose is to provide a standard for the PMIC5000, PMIC5010 device for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use. Committee(s): JC-40.1 Free download. Registration or login required. |