Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # |
Date |
|---|---|---|
THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD):Status: ReaffirmedApril 1999, April 2002 |
JESD531 | Jul 1986 |
This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002. Committee(s): JC-22.4 Free download. Registration or login required. |
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STANDARD FOR DESCRIPTION OF 54/74HCXXXX AND 54/74HCTXXXX HIGH SPEED CMOS DEVICES: |
JESD7-A | Aug 1986 |
This standard provides uniformity, multiplicity of sources, eliminate confusion, and ease of device specification and design by users for HC, and HCT CMOS devices. This standard specifies electrical parameters. It also includes appendices listing part numbers. Committee(s): JC-40.2 Free download. Registration or login required. |
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SEMICONDUCTOR POWER CONTROL MODULES:Status: ReaffirmedJune 1992, April 1999, April 2002 |
JESD14 | Nov 1986 |
Semiconductor Power Control Modules (SPCM) are modules consisting of thyristors or transistors, or both, as the primary controlling elements. Methods of manufacture of semiconductor power control modules include the assembling of individual components and the use of semiconductor hybrids or monolithic processing technologies, or both. Committee(s): JC-22.2 Free download. Registration or login required. |
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NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES:Status: Reaffirmed November 1995, September 2009 |
JESD321-C | Feb 1987 |
This standard gives the system for numbering like-named electrodes or terminal functions in semiconductor devices and for assigning numerical designations to units of multiple-unit semiconductor devices. It applies to both integrated circuits and discrete devices. Formerly known as EIA-321-C and ANSI/EIA-321-C-1987. Committee(s): JC-10 Free download. Registration or login required. |
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ADDENDUM No. 4 to JESD12 - METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS: |
JESD12-4 | Apr 1987 |
This standard defines how to specify various performance parameters of semicustom ICs, including cell and interconnect propagation delays, input/output levels and capacitance, and power dissipation. Committee(s): JC-44 Free download. Registration or login required. |
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