Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # |
Date |
|---|---|---|
MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHFStatus: ReaffirmedApril 1999, March 2009 |
JESD311A | Nov 1981 |
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283, Test Method for Transistor Noise Figure Measurements at Medium Frequencies, Rescinded November 1981. Formerly known as RS-311 and/or EIA-311-A.
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-25 Free download. Registration or login required. |
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DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES:Status: Reaffirmed November 1995, November 1999, May 2003 |
JESD370B | Feb 1982 |
This standard includes several new items and has been completely rewritten from the original EIA-370. The first is a new letter symbol C so that a JEDEC type designation may now be 2C1234, to indicate that a chip is being designated that if it were properly mounted on the package registered for the 2N1234, it would display characteristics similar to those of the 2N1234. The second major addition is the method for assigning the first numeric symbol for type designations of optoelectronic devices. ANSI/EIA-370-B-1992. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-10 Free download. Registration or login required. |
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MEASUREMENT OF TEMPERATURE COEFFICIENT OF VOLTAGE REGULATOR DIODES:Status: ReaffirmedApril 1999, April 2002 |
JESD5 | Feb 1982 |
This standard is designed to define voltage-temperature characteristic measurement techniques and a method of calculation. Although many methods could be defined, this method provides a desired uniformity and lends itself to production testing. Formerly JEDEC Suggested Standard No. 5A A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-22.4 Free download. Registration or login required. |
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LEADLESS CHIP CARRIER PINOUTS STANDARDIZED FOR LINEARS: |
JESD1 | Apr 1982 |
This standard shows how to convert existing DIP pinouts for op-amps, comparators, and D/A converters, to chip carrier packages. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-41 Free download. Registration or login required. |
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TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES: |
JESD23 | May 1982 |
This standard specifies a collection of procedures for testing and character designation of liquid crystal devices. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Free download. Registration or login required. |
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