Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # |
Date |
|---|---|---|
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:Status: ReaffirmedApril 1981, April 1999, March 2009 |
JESD398 | Jul 1972 |
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398 Committee(s): JC-25 Free download. Registration or login required. |
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MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS:Status: ReaffirmedSeptember 1981, April 2000, October 2002 |
JESD25 | Nov 1972 |
This standard provides a test method and definition for small-signal conditions at microwave frequencies. Committee(s): JC-25 Free download. Registration or login required. |
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THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS:Status: ReaffirmedApril 1981, April 2001 |
JESD313-B | Oct 1975 |
This standard provides a test method for measuring thermal resistance for conduction cooled power transistors. Committee(s): JC-25 Free download. Registration or login required. |
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LOW FREQUENCY POWER TRANSISTORS:Status: ReaffirmedSeptember 1981, October 2002 |
JESD10 | Jan 1976 |
This standard consists of a listing of letter symbols, terms, and definitions that are used in power transistors. It also includes information on JEDEC registration procedures, verification tests, and thermal characteristics. Committee(s): JC-25 Free download. Registration or login required. |
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STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS:Status: ReaffirmedApril 1999, March 2009 |
JESD435 | Apr 1976 |
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435 Committee(s): JC-25 Free download. Registration or login required. |
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