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Title	Document #	Date
TEST METHODS FOR THE COLLECTOR-BASE TIME CONSTANT AND FOR THE RESISTIVE PART OF THE COMMON-EMITTER INPUT IMPEDANCE Status: Reaffirmed November 1963, June 1972, April 1981, April 1999, October 2002	JESD284-A	Nov 1963
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002. Committee(s): JC-25 Free download. Registration or login required.
RANGES AND CONDITIONS FOR SPECIFYING BETA FOR LOW POWER, AUDIO FREQUENCY TRANSISTORS FOR ENTERTAINMENT SERVICE: Status: ReaffirmedApril 1981, April 1999, March 2009	JESD302	Jan 1965
This standard establishes the preferred rating ranges and conditions for specifying beta for low power, audio frequency transistors intended for entertainment service. Formerly known as RS-302 and EIA-302. Committee(s): JC-25 Free download. Registration or login required.
MEASUREMENT OF SMALL SIGNAL HF, VHF, AND UHF POWER GAIN OF TRANSISTORS Status: Reaffirmed April 1981, April 1999, March 2009	JESD306	May 1965
This standard provides a method of measurement for small-signal HF, VHF, and UHF power gain of low power transistors. Formerly known as RS-306 and/or EIA-306. Committee(s): JC-25 Free download. Registration or login required.
VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT Status: Reaffirmed January 1992, April 1999, April 2002	JESD307	May 1965
This standard is intended to cover the measurement of noise voltage in voltage regulator diodes in the reverse breakdown region. It describes noise voltage measurements at specified conditions, but may be used as a guide for making such measurements at other than specified conditions. Formerly known as RS-307 and/or EIA-307 Committee(s): JC-22.4 Free download. Registration or login required.
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE: Status: ReaffirmedSeptember 1981, April 1999, October 2002	JESD6	Feb 1967
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance. Committee(s): JC-25 Free download. Registration or login required.
STANDARD FOR THE MEASUREMENT OF CRE Status: Reaffirmed April 1981, April 1999, March 2009	JESD340	Nov 1967
This standard offers an easily measured parameter which is one of the significant characteristics in determining the stability of a transistor intended for small-signal operation. The measurement technique allows rapid testing. Its correlation to AC stability will help to establish the interchangeability of a device. Formerly known as RS-340 and/or EIA-340. Committee(s): JC-25 Free download. Registration or login required.
THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD Status: Reaffirmed April 1981, April 1999, March 2009	JESD353	Apr 1968
This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353 Committee(s): JC-25 Free download. Registration or login required.
THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz Status: Reaffirmed April 1981, April 1999, March 2009	JESD354	Apr 1968
This standard provides a method for determining values, for device registration purposes, for transistor equivalent noise voltage and equivalent noise current at frequencies up to 20 kHz. This method is applicable to transistors whose noise has a Gaussian, flat (white) or I/f power distribution. Formerly known as RS-354 and/or EIA-354 Committee(s): JC-25 Free download. Registration or login required.
THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO: Status: ReaffirmedApril 1981, April 1999, March 2009	JESD371	Feb 1970
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor short-circuit forward current transfer ratio, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-371 and/or EIA-371. Committee(s): JC-25 Free download. Registration or login required.
THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS: Status: ReaffirmedApril 1981, April 1999, March 2009	JESD372	May 1970
This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372 Committee(s): JC-25 Free download. Registration or login required.
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE: Status: ReaffirmedApril 1981, April 1999, March 2009	JESD398	Jul 1972
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398 Committee(s): JC-25 Free download. Registration or login required.
MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS: Status: ReaffirmedSeptember 1981, April 2000, October 2002	JESD25	Nov 1972
This standard provides a test method and definition for small-signal conditions at microwave frequencies. Committee(s): JC-25 Free download. Registration or login required.
THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS: Status: ReaffirmedApril 1981, April 2001	JESD313-B	Oct 1975
This standard provides a test method for measuring thermal resistance for conduction cooled power transistors. Committee(s): JC-25 Free download. Registration or login required.
LOW FREQUENCY POWER TRANSISTORS: Status: ReaffirmedSeptember 1981, October 2002	JESD10	Jan 1976
This standard consists of a listing of letter symbols, terms, and definitions that are used in power transistors. It also includes information on JEDEC registration procedures, verification tests, and thermal characteristics. Committee(s): JC-25 Free download. Registration or login required.
STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS: Status: ReaffirmedApril 1999, March 2009	JESD435	Apr 1976
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435 Committee(s): JC-25 Free download. Registration or login required.
SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICES Status: Reaffirmed October 1988, September 1996, September 2009, May 2018, October 2024	JESD471	Feb 1980
This standard will be useful to anyone engaged in handling semiconductor devices and integrated circuits that are subject to permanent damage due to electrostatic potentials. The standard establishes a symbol and label that will gain the attention of those persons who might inflict electrostatic damage to the device. The label which is placed on the lowest practical level of packaging contains the words 'ATTENTION - OBSERVE PRECAUTIONS FOR HANDLING ELECTROSTATIC SENSITIVE DEVICES'. The symbol contained in this label, which may be used on the device itself, shows a hand in a triangle with a bar through it. Formerly known as EIA-471. Committee(s): JC-14, JC-14.3
STANDARD SPECIFICATION FOR DESCRIPTION OF B SERIES CMOS DEVICES:	JESD13-B	May 1980
This standard provides for uniformity, multiplicity of sources, elimination of confusion, and ease of device specifications and system design by users. It gives electrical levels and timing diagrams for B Series CMOS devices. Committee(s): JC-40.2 Free download. Registration or login required.
STANDARD LIST OF VALUES TO BE USED IN SEMICONDUCTOR DEVICE SPECIFICATIONS AND REGISTRATION FORMAT: Status: ReaffirmedMarch 2001	JESD419-A	Oct 1980
This document contains standard lists of values which are recommended for use in semiconductor device specification and JEDEC Registration Formats. Good reasons should exist in those cases where values are used that are not included in these lists. Formerly known as EIA-419-A, that superseded JEP74 (February 1996). Committee(s): JC-25 Free download. Registration or login required.
STANDARD TEST PROCEDURE FOR NOISE MARGIN MEASUREMENTS FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS Status: Rescinded, October 2008	JESD390A	Feb 1981
Reaffirmed September 2003 Committee(s): JC-13, JC-13.2 Free download. Registration or login required.
METHOD OF DIODE Q MEASUREMENT Status: Reaffirmed April 1999, April 2002	JESD381-A	Nov 1981
This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002. Committee(s): JC-22.4 Free download. Registration or login required.

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