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Title	Document #	Date
GENERAL STANDARD FOR STATISTICAL PROCESS CONTROL (SPC) - SUPERSEDED by EIA-557-A Status: Rescinded	JESD19	Jul 1988
Committee(s): JC-13 Free download. Registration or login required.
LATCH-UP IN CMOS INTEGRATED CIRCUITS - SUPERSEDED BY JESD78, February 1999 Status: RescindedFebruary 1999	JESD17	Aug 1988
This document is no longer available via the JEDEC website to obtain a copy please contact JEDEC. Committee(s): JC-40.2 Free download. Registration or login required.
ADDENDUM No. 5 to JESD12 - DESIGN FOR TESTABILITY GUIDELINES:	JESD12-5	Aug 1988
This standard is intended to provide circuit designers with the information needed to develop complex integrated circuits that can be reliably and economically tested without compromising flexibility. Committee(s): JC-44 Free download. Registration or login required.
ADDENDUM No. 1 to JESD99, TERMS, DEFINITIONS, AND LETTER SYMBOLS FOR ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS Status: Incorporated into JESD99-A, May 2000	JESD99-1	Jul 1989
This addendum has now been incorporated into JESD99. Committee(s): JC-10 Free download. Registration or login required.
ADDENDUM No. 1 to JESD24 - METHOD FOR MEASUREMENT OF POWER DEVICE TURN-OFF SWITCHING LOSS: Status: ReaffirmedApril 1999, October 2002	JESD24- 1	Oct 1989
Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the measurement of turn off loss for bipolar, IGBT and MOSFET power semiconductors. This method can be used as a standard for evaluating power semiconductor turn-off switching loss capability and defines standard terminology that should be referenced within the electronic industry. Committee(s): JC-25 Free download. Registration or login required.
HIGH TEMPERATURE CONTINUITY Status: Rescinded November 1999	JESD22-C100-A	Jan 1990
Committee(s): JC-14.1
STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES: Release Number: Pt 2	JESD20	Jan 1990
This standard describes electrical parameters for this class of CMOS devices. Committee(s): JC-40.2 Free download. Registration or login required.
STANDARD FOR DESCRIPTION OF 54/74ACXXXXX AND 54/74ACTXXXXX ADVANCED HIGH-SPEED CMOS DEVICES: Release Number: Pt 1	JESD20	Jan 1990
This standard describes electrical parameters for this class of CMOS devices. Committee(s): JC-40.2 Free download. Registration or login required.
GENERAL SPECIFICATION FOR PLASTIC ENCAPSULATED MICROCIRCUITS FOR USE IN RUGGED APPLICATIONS - RESCINDED, July 2001 Status: Rescinded	JESD26-A	Apr 1990
Committee(s): JC-13.2 Free download. Registration or login required.
ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHOD: Status: Reaffirmedoctober 2002	JESD24- 5	Aug 1990
This method describes a means for testing the ability of a power switching device to withstand avalanche breakdown. Committee(s): JC-25 Free download. Registration or login required.

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