Global Standards for the Microelectronics Industry
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Displaying 1 - 2 of 2 documents.
Title | Document # |
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HSUL_12 LPDDR2 AND LPDDR3 I/O WITH OPTIONAL ODT |
JESD8-22B | Apr 2014 |
This standard defines the input, output specifications and ac test conditions for devices that are designed to operate in the High Speed Unterminated Logic (HSUL_12) logic switching range, nominally 0 V to 1.2 V. The standard may be applied to ICs operating with separate VDD and VDDQ supply voltages. Committee(s): JC-16 Free download. Registration or login required. |
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UNIFIED WIDE POWER SUPPLY VOLTAGE RANGE CMOS DC INTERFACE STANDARD FOR NON-TERMINATED DIGITAL INTEGRATED CIRCUITS |
JESD8-23 | Oct 2009 |
This standard defines DC interface parameters and test conditions for a family of non-terminated CMOS digital circuits intended for use over a wide power supply voltage range. The standard bridges a number of existing JEDEC standards in the JESD8-x family to facilitate applications that operate over an ultra-wide power supply voltage range in order to achieve lower power dissipation or higher performance. Committee(s): JC-16 Free download. Registration or login required. |