Global Standards for the Microelectronics Industry
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Displaying 1 - 3 of 3 documents.
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Document # | Date |
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NAND Flash Interface Interoperability |
JESD230F.01 | May 2023 |
This standard was jointly developed by JEDEC and the Open NAND Flash Interface Workgroup, hereafter referred to as ONFI. This standard defines a standard NAND flash device interface interoperability standard that provides means for system be designed that can support Asynchronous SDR, Synchronous DDR and Toggle DDR NAND flash devices that are interoperable between JEDEC and ONFI member implementations. Committee(s): JC-42.4 Free download. Registration or login required. |
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Secure Serial Flash Bus TransactionsRelease Number: Version 1.0 |
JESD254 | Dec 2022 |
This standard describes SPI bus transactions intended to support Secure Flash operation on a serial memory device. The on-chip SFDP database described in JESD216 has been revised to include details about the secure transactions. This ballot does not describe the SFDP revisions or the secure packet structure. Patents(): Infineon- US 10868679B1 and Micron- US 9009394B2 Free download. Registration or login required. |
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SERIAL FLASH DISCOVERABLE PARAMETERS (SFDP)This document replaces JESD216F.01, Editorial changes to this document were approved by the TG, June 2022 |
JESD216F.02 | Jun 2022 |
The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the functional and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter tables can be interrogated by host system software to enable adjustments needed to accommodate divergent features from multiple vendors. Any company may request a Function Specific ID by making a request to the JEDEC office at juliec@jedec.org. Please include “Function Specific ID Request, JESD216” in the email subject line. Item 1775.73. Editorial changes listed in Annex, from original publication of JESD216F (December 2021). Committee(s): JC-42.4 Free download. Registration or login required. |