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Displaying 1 - 5 of 8 documents. Show 5 results per page.

Title	Document #	Date
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS	JESD210A	Mar 2017
This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD. Committee(s): JC-22.2, JC-22.5 Free download. Registration or login required.
DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES: Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011	JESD4	Nov 1983
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required.
MEASUREMENT METHOD FOR THERMAL RESISTANCE OF BRIDGE RECTIFIER ASSEMBLIES: RESCINDED, June 2002. Replaced by JESD282-B. Status: RescindedJune 2002	JESD45	Dec 1994
Committee(s): JC-22.2 Free download. Registration or login required.
REVERSE RECOVERY CHARACTERISTICS OF SILICON DIODES: RESCINDED June 2002. Status: Rescinded	JESD41	May 1995
Committee(s): JC-22.1 Free download. Registration or login required.
SEMICONDUCTOR POWER CONTROL MODULES: Status: ReaffirmedJune 1992, April 1999, April 2002	JESD14	Nov 1986
Semiconductor Power Control Modules (SPCM) are modules consisting of thyristors or transistors, or both, as the primary controlling elements. Methods of manufacture of semiconductor power control modules include the assembling of individual components and the use of semiconductor hybrids or monolithic processing technologies, or both. Committee(s): JC-22.2 Free download. Registration or login required.

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