Global Standards for the Microelectronics Industry
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Displaying 1 - 2 of 2 documents.
Title |
Document # | Date |
|---|---|---|
DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011 |
JESD4 | Nov 1983 |
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required. |
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SILICON RECTIFIER DIODES: |
JESD282B.01 | Nov 2002 |
This standard provided definitions, electrical characteristics circuit technology, letter symbols and registration format for diodes and stacks. It also covers rating and characteristics, manufacturing and performance as well as test practices to demonstrate the performance of semiconductor rectifier diodes and rectifier stacks used for the conversion and/or control of electric power. This version contains minor revisions to JESD282-B, April 2000. This document formerly known as EIA-282-A (February 1990), ANSI/EIA-282-A-1989. Committee(s): JC-22.2 Free download. Registration or login required. |
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