Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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Registration - 240 Pin DDR2 DIMM 1.00 mm Contact Centers, Press Fit Socket Outline. Item 11.14-111 |
SO-011A | Sep 2007 |
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11 Free download. Registration or login required. |
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Registration - Magazine Family, Dual-In-Line (DIP), 7.620 mm Row Spacing. Variations AA-AB. |
CO-001-B | May 1978 |
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11 Free download. Registration or login required. |
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Registration - TO-220 Magazine. |
CO-002-B | May 1978 |
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11 Free download. Registration or login required. |
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Registration - Magazine Family, Dual-In-Line (DIP), 7.620 mm Row Spacing. Variation AA. |
CO-003-B | May 1978 |
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11 Free download. Registration or login required. |
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Registration - Square Magazine for Dual-In-Line Product (DIP). Variation AA |
CO-004-B | May 1978 |
A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office. Committee(s): JC-11 Free download. Registration or login required. |