Global Standards for the Microelectronics Industry
Standards & Documents Search
| Title | Document # | Date |
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Marking, Symbols, and Labels of Leaded and Lead-Free Terminal Finished Materials Used in Electronic Assembly |
J-STD-609C.01 | Apr 2024 |
This standard applies to components and assemblies that contain Pb-free and Pb-containing solders and finishes, and it describes the marking and labeling of their shipping containers to identify their 2nd level terminal finish or material. Free download. Registration or login required. |
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CUSTOMER NOTIFICATION STANDARD FOR PRODUCT/PROCESS CHANGES BY ELECTRONIC PRODUCT SUPPLIERS |
J-STD-046 | Jul 2016 |
This standard is applicable to suppliers of, and affected customers for, electronic products and their constituent components. This standard establishes the requirements for timely customer notification of changes to electronic products and associated processes. This document replaces JESD46. Committee(s): JC-14.4 Free download. Registration or login required. |
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ADDENDUM No. 1 to EIA-318 - CHARACTERIZATION OF A REVERSE TEST FIXTURE: SUPERSEDED BY EIA-318-B, July 1996.Status: Rescinded |
EIA318-1 | Feb 1981 |
Committee(s): JC-22.4 Free download. Registration or login required. |
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MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES:Status: Reaffirmed |
EIA318-B | Jul 1996 |
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement. Committee(s): JC-22.4 Free download. Registration or login required. |
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AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES:Status: ReaffirmedFebruary 1972, November 2002 |
EIA323 | Mar 1966 |
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device. Committee(s): JC-22.1 Free download. Registration or login required. |
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PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE:Status: ReaffirmedFebruary 1984 |
EIA365 | Nov 1969 |
The purpose of this standard is to classify the output of solar cells for space vehicle service in accordance with requirements of EIA Format JS4-RDF4. Committee(s): JC-23.1 Free download. Registration or login required. |
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ADDENDUM No. 1 TO EIA-397: |
EIA397-1 | Jul 1980 |
A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972. Committee(s): JC-22.1 Free download. Registration or login required. |
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RECOMMENDED STANDARD FOR THYRISTORS: |
EIA397 | Jun 1972 |
One section of this standard presents a thorough explanation of thyristor principals, defining thedifferent classes of these devices, their Physical structure and detailing the numerous test methods and ratings required in their application to electronic and power circuitry. Another section presents a universally accepted listing of letter symbols. Considerable effort is devoted to the use of JEDEC Type Registration System as related to thyristors. This will permit the device manufacturer to employ a uniform procedure in the development of maximum rating and presentation of performance data. Committee(s): JC-22.1 Free download. Registration or login required. |
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NATIONAL ELECTRONIC PROCESS CERTIFICATION STANDARD; GOVERNMENT CONTRACTORS:Removed: August 25, 2003 |
EIA599-A | Jan 1998 |
Due to notification from the JC-14.4 subcommittee that the material contained in EIA599 has been replaced by the ISO 9000 series, the JEDEC Board of Directors, at its August 2003 meeting, approved to remove this standard from the JEDEC Free Download Area. Committee(s): JC-14.4 |
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TYPE DESIGNATION SYSTEM FOR MICROELECTRONIC DEVICESStatus: Rescinded September 1993 |
EIA428-A | Jan 1988 |
Committee(s): JC-10 |
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