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Title	Document #	Date
LOW POWER DOUBLE DATA RATE (LPDDR5) Status: Superseded July 2021	JESD209-5A	Jan 2020
This document has been replaced by JESD209-5B. Item 1854.99A. Members of JC-42.6 may access a reference copy on the restricted members' website. Committee(s): JC-42.6
DDR5 SDRAM Release Number: Version 1.31	JESD79-5C.01	Jul 2024
Version 1.31 This standard defines the DDR5 SDRAM specification, including features, functionalities, AC and DC characteristics, packages, and ball/signal assignments. The purpose of this Standard is to define the minimum set of requirements for JEDEC compliant 8 Gb through 32 Gb for x4, x8, and x16 DDR5 SDRAM devices. This standard was created based on the DDR4 standards (JESD79-4) and some aspects of the DDR, DDR2, DDR3, and LPDDR4 standards (JESD79, JESD79-2, JESD79-3, and JESD209-4). Committee(s): JC-42, JC-42.3 Available for purchase: $423.00 Add to Cart To help cover the costs of producing standards, JEDEC is now charging for non-member access to selected standards and design files. Most of the content on this site remains free to download with registration. Paying JEDEC member companies enjoy free access to all content. Learn more and apply today. Paying JEDEC Members may login for free access.
Temperature Range and Measurement Standards for Components and Modules	JESD402-1B	Sep 2024
This document specifies standard temperature ranges that may be used, by way of referencing JESD402-1, in other standards, specifications, and datasheets when defining temperature related specifications. Committee(s): JC-42 Free download. Registration or login required.
DDRx SPREAD SPECTRUM CLOCKING (SSC) STANDARD	JESD404-1	Nov 2020
Definition for all DDRx component documents to reference. This is generic to any DDRx technology. Item 1842.34 Committee(s): JC-42.3C Free download. Registration or login required.
NEAR-TERM DRAM LEVEL ROWHAMMER MITIGATION	JEP300-1	Mar 2021
RAM process node transistor scaling for power and DRAM capacity has made DRAM cells more sensitive to disturbances or transient faults. This sensitivity becomes much worse if external stresses are applied in a meticulously manipulated sequence, such as Rowhammer. Rowhammer related papers have been written outside of JEDEC, but some assumptions used in those papers didn’t explain the problem very clearly or correctly, so the perception for this matter is not precisely understood within the industry. This publication defines the problem and recommends following mitigations to address such concerns across the DRAM industry or academia. Item 1866.01. Committee(s): JC-42 Free download. Registration or login required.

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