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Title	Document #	Date
STANDARD TEST LOADS FOR DUAL-SUPPLY LEVEL TRANSLATION DEVICES	JESD203	Nov 2005
This standard defines ac test loads for dual-supply level translation devices. Uniform test loads enable easy comparison of electrical parameters of dual-supply level translation devices across functions, logic families and IC suppliers. This standard is only intended to apply to devices released subsequent to th publication of this document. Committee(s): JC-40, JC-40.1 Free download. Registration or login required.
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS:	JEB15	Jan 1969
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits. Committee(s): JC-40
TS511X, TS521X Serial Bus Thermal Sensor Device Standard	JESD302-1A	Aug 2023
This standard defines the specifications of interface parameters, signaling protocols, and features for fifth generation Temperature Sensor (TS5) as used for memory module applications. These device operate on I2C and I3C two-wire serial bus interface. The designation TS521X and TS511X refers to the device specified by this document. Committee(s): JC-40.1 Free download. Registration or login required.

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