Global Standards for the Microelectronics Industry
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MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHFStatus: ReaffirmedApril 1999, March 2009
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283, Test Method for Transistor Noise Figure Measurements at Medium Frequencies, Rescinded November 1981. Formerly known as RS-311 and/or EIA-311-A.