Global Standards for the Microelectronics Industry
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MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:Status: ReaffirmedApril 1981, April 1999, March 2009
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398