Global Standards for the Microelectronics Industry
Standards & Documents Search
Title |
Document # | Date |
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ADDENDUM No. 1 TO EIA-397: |
EIA397-1 | Jul 1980 |
A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972. Committee(s): JC-22.1 Free download. Registration or login required. |
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AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES:Status: ReaffirmedFebruary 1972, November 2002 |
EIA323 | Mar 1966 |
This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device. Committee(s): JC-22.1 Free download. Registration or login required. |
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AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS |
JESD210A | Mar 2017 |
This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD. Committee(s): JC-22.2, JC-22.5 Free download. Registration or login required. |
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DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011 |
JESD4 | Nov 1983 |
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required. |
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FORWARD TURN-ON TIME MEASUREMENT ON SEMI-DIODES - INCORPORATED INTO EIA-282-A.Status: Rescinded |
JEP87 | Jan 1992 |
Committee(s): JC-22.2 |
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