Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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THERMAL RESISTANCE AND THERMAL IMPEDANCE TEST METHODS FOR STUD AND BASE-MOUNTED RECTIFIER DIODES AND THYRISTORSStatus: Rescinded |
JEP88 | Jan 1974 |
Committee(s): JC-22.1 |
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HANDLING AND INSTALLATION OF POWER SEMICONDUCTORS IN DISC TYPE PACKAGES: Included in JESD282 and EIA397.Status: RescindedJun-92 |
TENTSTD11 | Jan 1973 |
Committee(s): JC-22.2 |
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STANDARD FOR SELENIUM SURGE SUPPRESSORS: |
TENTSTD12 | Nov 1973 |
The suppresser furnished under this standard shall be a product that has been tested and meets the definitions and minimum requirements specified herein. Committee(s): JC-22.5 |
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Registration Data Format (RDF) Homepage |
RDF Homepage | Aug 2007 |
RDF's contain Engineering information in the form of a list of specific electrical and mechanical parameters necessary for the characterization of a particular class of solid state devices. These documents are maintained by the JC-22 Committee. Committee(s): JC-22.2 |
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DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011 |
JESD4 | Nov 1983 |
This standard defines reference distances between terminals of the device and the external package at specific voltages. Committee(s): JC-22.2 Free download. Registration or login required. |
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ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING |
JESD211.01 | Nov 2012 |
This standard is applicable to diodes that are used as voltage regulators and voltage references. It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. Free download. Registration or login required. |