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Displaying 1 - 16 of 16 documents. Show 5 | 10 results per page.

Title Document # Date

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES:

Status: ReaffirmedFebruary 1972, November 2002 		EIA323 Mar 1966

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Committee(s): JC-22.1

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ADDENDUM No. 1 TO EIA-397:

 EIA397-1 Jul 1980

A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972.

Committee(s): JC-22.1

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SEMICONDUCTOR POWER CONTROL MODULES:

Status: ReaffirmedJune 1992, April 1999, April 2002 		JESD14 Nov 1986

Semiconductor Power Control Modules (SPCM) are modules consisting of thyristors or transistors, or both, as the primary controlling elements. Methods of manufacture of semiconductor power control modules include the assembling of individual components and the use of semiconductor hybrids or monolithic processing technologies, or both.

Committee(s): JC-22.2

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REVERSE RECOVERY CHARACTERISTICS OF SILICON DIODES: RESCINDED June 2002.

Status: Rescinded 		JESD41 May 1995

Committee(s): JC-22.1

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MEASUREMENT METHOD FOR THERMAL RESISTANCE OF BRIDGE RECTIFIER ASSEMBLIES: RESCINDED, June 2002. Replaced by JESD282-B.

Status: RescindedJune 2002 		JESD45 Dec 1994

Committee(s): JC-22.2

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TRANSIENT VOLTAGE SUPPRESSOR STANDARD FOR THYRISTOR SURGE PROTECTIVE DEVICE:

Status: ReaffirmedNovember 2006 		JESD66 Nov 1999

This standard is applicable to Thyristor Surge Protective Devices. It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. The intended users of this standard are those interested in Thyristor Surge Protective Device characterization and rating verification. These devices are used primarily by the telecommunications industry to protect circuits from harmful overvoltages. The Thyristor Surge Protective Device (TSPD) is a semiconductor device that is finding widespread application in the telecommunication industry. The intent of this stand is to provide information on test methods that will reduce the possibility of disagreement and misunderstanding between TSPD vendors and users, and facilitate the determination of device interchangeability.

Committee(s): JC-22.5

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RECOMMENDED STANDARD FOR THYRISTORS:

 EIA397 Jun 1972

One section of this standard presents a thorough explanation of thyristor principals, defining thedifferent classes of these devices, their Physical structure and detailing the numerous test methods and ratings required in their application to electronic and power circuitry. Another section presents a universally accepted listing of letter symbols. Considerable effort is devoted to the use of JEDEC Type Registration System as related to thyristors. This will permit the device manufacturer to employ a uniform procedure in the development of maximum rating and presentation of performance data.

Committee(s): JC-22.1

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AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS

 JESD210A Mar 2017

This standard is applicable to avalanche breakdown diodes when used as a surge protector or transient voltage suppressor (TVS). It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics. This standard may be applied to other surge-protection components with similar characteristics as the ABD.

Committee(s): JC-22.2, JC-22.5

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SILICON RECTIFIER DIODES:

 JESD282B.02 Mar 2023

Terminology update.   

This legacy document is a comprehensive users’ guide for silicon rectifier diode applications.

Committee(s): JC-22.2

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FORWARD TURN-ON TIME MEASUREMENT ON SEMI-DIODES - INCORPORATED INTO EIA-282-A.

Status: Rescinded 		JEP87 Jan 1992

Committee(s): JC-22.2

THERMAL RESISTANCE AND THERMAL IMPEDANCE TEST METHODS FOR STUD AND BASE-MOUNTED RECTIFIER DIODES AND THYRISTORS

Status: Rescinded 		JEP88 Jan 1974

Committee(s): JC-22.1

HANDLING AND INSTALLATION OF POWER SEMICONDUCTORS IN DISC TYPE PACKAGES: Included in JESD282 and EIA397.

Status: RescindedJun-92 		TENTSTD11 Jan 1973

Committee(s): JC-22.2

STANDARD FOR SELENIUM SURGE SUPPRESSORS:

 TENTSTD12 Nov 1973

The suppresser furnished under this standard shall be a product that has been tested and meets the definitions and minimum requirements specified herein.

Committee(s): JC-22.5

Registration Data Format (RDF) Homepage

 RDF Homepage Aug 2007

RDF's contain Engineering information in the form of a list of specific electrical and mechanical parameters necessary for the characterization of a particular class of solid state devices. These documents are maintained by the JC-22 Committee.

Committee(s): JC-22.2

See RDF Homepage information

DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:

Status: ReaffirmedJanuary 1991, April 1999, April 2002, November 2011 		JESD4 Nov 1983

This standard defines reference distances between terminals of the device and the external package at specific voltages.

Committee(s): JC-22.2

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ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING

 JESD211.01 Nov 2012

This standard is applicable to diodes that are used as voltage regulators and voltage references. It describes terms and definitions and explains methods for verifying device ratings and measuring device characteristics.

Committee(s): JC-22, JC-22.2

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