Global Standards for the Microelectronics Industry
Standards & Documents Search
Search by Keyword or Document Number
Filter by committees:
- JC-11: Mechanical Standardization (3) Apply JC-11: Mechanical Standardization filter
- JC-13: Government Liaison (3) Apply JC-13: Government Liaison filter
- (-) Remove JC-14: Quality and Reliability of Solid State Products filter JC-14: Quality and Reliability of Solid State Products
- JC-15: Thermal Characterization Techniques for Semiconductor Packages (1) Apply JC-15: Thermal Characterization Techniques for Semiconductor Packages filter
- JC-16: Interface Technology (1) Apply JC-16: Interface Technology filter
Filter by document type:
- JESD (JEDEC Standards) (100) Apply JESD (JEDEC Standards) filter
- JEP (JEDEC Publications) (49) Apply JEP (JEDEC Publications) filter
- J-STD- (Joint IPC/JEDEC Standards) (8) Apply J-STD- (Joint IPC/JEDEC Standards) filter
- JS (Joint Standard) (6) Apply JS (Joint Standard) filter
- EIA (EIA Standards) (1) Apply EIA (EIA Standards) filter
- IPC/JEDEC (Joint IPC/JEDEC Standard) (1) Apply IPC/JEDEC (Joint IPC/JEDEC Standard) filter
- JEB (JEDEC Engineering Bulletins) (1) Apply JEB (JEDEC Engineering Bulletins) filter
- JES (JEDEC Specifications) (1) Apply JES (JEDEC Specifications) filter
- JIG (Joint Industry Guide) (1) Apply JIG (Joint Industry Guide) filter
- JP (Joint Publication) (1) Apply JP (Joint Publication) filter
- JTR (Joint Standard) (1) Apply JTR (Joint Standard) filter
Filter by keywords:
- Acceleration Factor (3) Apply Acceleration Factor filter
- Activation Energy (3) Apply Activation Energy filter
- CDM (5) Apply CDM filter
- Charged Device Model (3) Apply Charged Device Model filter
- DC Stress (2) Apply DC Stress filter
- DIELECTRIC BREAKDOWN (2) Apply DIELECTRIC BREAKDOWN filter
- Electromigration (6) Apply Electromigration filter
- ESD (11) Apply ESD filter
- evaluation (2) Apply evaluation filter
- Failure (3) Apply Failure filter
- Failure Analysis (2) Apply Failure Analysis filter
- Failure Mechanism (2) Apply Failure Mechanism filter
- GaAs FETs (2) Apply GaAs FETs filter
- Growth (2) Apply Growth filter
- HBM (3) Apply HBM filter
- Hot Carrier (2) Apply Hot Carrier filter
- Human Body Model (2) Apply Human Body Model filter
- Inspection (2) Apply Inspection filter
- Legibility (2) Apply Legibility filter
- Life Test (2) Apply Life Test filter
- low-k (2) Apply low-k filter
- Machine Model (2) Apply Machine Model filter
- Mechanical Shock (2) Apply Mechanical Shock filter
- Metallization Lines (2) Apply Metallization Lines filter
- MM (2) Apply MM filter
- Moisture (3) Apply Moisture filter
- MOSFET (2) Apply MOSFET filter
- PMOS (2) Apply PMOS filter
- Qualification (6) Apply Qualification filter
- radiation (2) Apply radiation filter
- Reflow (2) Apply Reflow filter
- Reliability (5) Apply Reliability filter
- Reliability Monitoring (4) Apply Reliability Monitoring filter
- Sensitivity Testing (2) Apply Sensitivity Testing filter
- SER (3) Apply SER filter
- SIV (3) Apply SIV filter
- Solder (2) Apply Solder filter
- solder bump (2) Apply solder bump filter
- Solderability (2) Apply Solderability filter
- Storage Life (2) Apply Storage Life filter
- Stress Migration (2) Apply Stress Migration filter
- Stress Test (2) Apply Stress Test filter
- Temperature (2) Apply Temperature filter
- Temperature Cycling (4) Apply Temperature Cycling filter
- Test Method (5) Apply Test Method filter
- Thermal Shock (2) Apply Thermal Shock filter
- Thin Dielectrics (3) Apply Thin Dielectrics filter
- Tin (2) Apply Tin filter
- Tin Alloy (2) Apply Tin Alloy filter
- Wafer-Level Testing (3) Apply Wafer-Level Testing filter
