Global Standards for the Microelectronics Industry
Standards & Documents Search
Title | Document # | Date |
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PROCESS CHARACTERIZATION GUIDELINE |
JEP132A.01 | Dec 2022 |
This guideline provides a methodology to characterize a new or existing process and is applicable to any manufacturing or service process. It describes when to use specific tools such as failure mode effects analysis (FEMA), design or experiments (DOE), measurement system evaluation (MSE), capability analysis (CpK), statistical process control (SPC), and problem solving tools. It also provides a brief description of each tool. Committee(s): JC-13 Free download. Registration or login required. |
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GENERAL STANDARD FOR STATISTICAL PROCESS CONTROL (SPC) - SUPERSEDED by EIA-557-AStatus: Rescinded |
JESD19 | Jul 1988 |
Committee(s): JC-13 Free download. Registration or login required. |
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GENERAL SPECIFICATION FOR PLASTIC ENCAPSULATED MICROCIRCUITS FOR USE IN RUGGED APPLICATIONS - RESCINDED, July 2001Status: Rescinded |
JESD26-A | Apr 1990 |
Committee(s): JC-13.2 Free download. Registration or login required. |
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PROCUREMENT QUALITY OF SOLID STATE COMPONENTS BY GOVERNMENT CONTRACTORS - SUPERSEDED BY EIA-623, July 1994Status: Superseded |
JESD40 | Jul 1994 |
Committee(s): JC-13 Free download. Registration or login required. |
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REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES - SUPERSEDED BY EIA-625, November 1994.Status: Superseded |
JESD42 | Mar 1994 |
Committee(s): JC-13 Free download. Registration or login required. |