Global Standards for the Microelectronics Industry
JC-40 Digital Logic
The products within JC-40's scope include digital integrated circuits without regard to their fabrication technology. The committee develops the definition of test parameters and their methods of measurement, and registration formats to promote standardization of type designations.
To accomplish these functions, the committee cooperates with other JEDEC committees and organizations on matters of terms and definitions, mechanical standardization, international standardization, and government liaison. The committee also maintains liaisons with user organizations to promote wide acceptance of the committee’s output.
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|TS511X, TS521X Serial Bus Thermal Sensor Device Standard||JESD302-1A||Aug 2023|
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|Fully Buffered DIMM Design for Test, Design for Validation (DFx)||JESD82-28A.01||Mar 2023|
|DEFINITION OF THE SSTVN16859 2.5-2.6 V 13-BIT TO 26-BIT SSTL_2 REGISTERED BUFFER FOR PC1600, PC2100, PC2700 AND PC3200 DDR DIMM APPLICATIONS||JESD82-13A.01||Mar 2023|
|DDR5 Registering Clock Driver Definition (DDR5RCD03)||JESD82-513||Feb 2023|
|DDR5 Registering Clock Driver Definition (DDR5RCD02)||JESD82-512||Feb 2023|
|DEFINITION OF THE SSTUA32S868 AND SSTUA32D868 REGISTERED BUFFER WITH PARITY FOR 2R X 4 DDR2 RDIMM APPLICATIONS||JESD82-17.01||Feb 2023|