Global Standards for the Microelectronics Industry
JEDEC Committee:
JC-13 Government Liaison
JC-13 is responsible for standardizing quality and reliability methodologies for solid state products used in military, space, and other environments requiring special-use condition capabilities beyond standard commercial practices. This includes long-term reliability and/or special screening requirements.
Its purpose is to provide the member companies and their customers with uniform, cost-effective, proven, customer-accepted methodologies for specifying and evaluating special-use products, with the end goal of enhancing the performance and reliability of those products. Activities include the development, coordination, and maintenance of standards documents regarding product quality and reliability, validation systems, and process management.
The committee also contributes to similar and related documents that are generated and maintained by other organizations. To accomplish this charter, the committee maintains liaisons with customers, other JEDEC committees, government agencies, and interested parties that have special application needs.
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Recent Documents
Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices | JESD625C.01 | Mar 2024 |
PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD) | JESD49B.01 | Oct 2023 |
GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID/MCM PRODUCTS | JEP142 | May 2023 |
Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification | JEP114A | May 2023 |
SELECTION OF BURN-IN / LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS | JEP163A | Jan 2023 |
PROCESS CHARACTERIZATION GUIDELINE | JEP132A.01 | Dec 2022 |
MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES | JESD89B | Sep 2021 |
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES | JESD31F | Aug 2021 |
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS | JESD243A | Jan 2021 |
REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION: | JEP121B | Dec 2020 |