Global Standards for the Microelectronics Industry
JC-14 Quality and Reliability of Solid State Products
JC-14 is responsible for standardizing quality and reliability methodologies for solid state products used in commercial applications such as computers, automobiles, telecommunications equipment, etc. It also includes developing standards for board-level reliability of solid state products used in commercial equipment.
The committee is comprised of both suppliers and users and furnishes a forum where concerns of the industry for solid state device quality and reliability issues can be resolved. The committee maintains liaisons with other JEDEC committees whose tasks are related to quality and reliability issues. In addition, the committee coordinates activities with other standards organizations such as IPC, IEC, and JEITA to help develop industry and worldwide standardization.
Find JC-14’s complete scope in JM18: JEDEC Committee Scope Manual.
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|SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION||JESD22-B118A||Nov 2021|
|TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE||JESD89-3B||Sep 2021|
|GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES||JESD31F||Aug 2021|
|COPY-EXACT PROCESS FOR MANUFACTURING||JEP185||Aug 2021|
|TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE||JESD89-2B||Jul 2021|
|TEST METHOD FOR REAL-TIME SOFT ERROR RATE||JESD89-1B||Jul 2021|
|HIGH TEMPERATURE STORAGE LIFE||JESD22-A103E.01||Jul 2021|
|METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS||JESD85A||Jul 2021|
|ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST||JESD22-A118B.01||May 2021|
|HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)||JESD22-A110E.01||May 2021|