JC-70 Recent News

JEDEC Wide Bandgap Power Semiconductor Committee Publishes Guideline for Switching Reliability Evaluation Procedures for GaN Devices	Feb 2020
JEDEC Wide Bandgap Power Semiconductor Committee Publishes its First Document: Test Method for Dynamic Resistance of GaN HEMT	Feb 2019
New JEDEC Committee for Wide Bandgap Power Semiconductors Invites Industry Participation	Dec 2017
New JEDEC Committee to Set Standards for Wide Bandgap Power Semiconductors	Sep 2017