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Global Standards for the Microelectronics Industry
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Main Memory: DDR SDRAM
Mobile Memory: LPDDR, Wide I/O
Flash Memory: SSDs, UFS, e.MMC, XFMD
Memory Configurations: JESD21-C
Memory Module Design File Registrations
Wide Bandgap Power Semiconductors: GaN, SiC
Registered Outlines: JEP95
JEP30: Part Model Guidelines
ESD: Electrostatic Discharge
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JC-11: Mechanical Standardization
JC-13: Government Liaison
JC-14: Quality and Reliability of Solid State Products
JC-15: Thermal Characterization Techniques for Semiconductor Packages
JC-16: Interface Technology
JC-40: Digital Logic
JC-42: Solid State Memories
JC-45: DRAM Modules
JC-63: Multiple Chip Packages
JC-64: Embedded Memory Storage & Removable Memory Cards
JC-70: Wide Bandgap Power Electronic Conversion Semiconductors
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JEDEC Awards: 2024 Honorees
JEDEC Awards: Distinguished Members Recognition
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Year in Review: 2023
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Members Area
Main menu
Standards & Documents
Search Standards & Documents
Recently Published Documents
Technology Focus Areas
Main Memory: DDR SDRAM
Mobile Memory: LPDDR, Wide I/O
Flash Memory: SSDs, UFS, e.MMC, XFMD
Memory Configurations: JESD21-C
Memory Module Design File Registrations
Wide Bandgap Power Semiconductors: GaN, SiC
Registered Outlines: JEP95
JEP30: Part Model Guidelines
ESD: Electrostatic Discharge
Lead-Free Manufacturing
Type Registration, Data Sheets
Order JEDEC Standard Manufacturer's ID Code
Order ID Code for Low Power Memories
Copyright Information
Document Translation
About JEDEC Standards
Committees
All Committees
JC-11: Mechanical Standardization
JC-13: Government Liaison
JC-14: Quality and Reliability of Solid State Products
JC-15: Thermal Characterization Techniques for Semiconductor Packages
JC-16: Interface Technology
JC-40: Digital Logic
JC-42: Solid State Memories
JC-45: DRAM Modules
JC-63: Multiple Chip Packages
JC-64: Embedded Memory Storage & Removable Memory Cards
JC-70: Wide Bandgap Power Electronic Conversion Semiconductors
News
News
JEDEC Awards: 2024 Honorees
JEDEC Awards: Distinguished Members Recognition
In Memoriam
JEDEC Quality & Reliability Task Group in China
Media Kit
Events & Meetings
All Events & Meetings
Automotive Electronics Forum
JEDEC DDR5 Workshop: Recordings for Sale
Join
Apply for Membership
Membership Benefits
Membership Dues & Details
About
Overview
Member List
Board of Directors
Committee Chairs
Industry Collaboration
Policies & Governance
Patent Policy
JEDEC History
Pre-1960s
1960s
1970s
1980s
1990s
2000s
2010s
Contact
RSS Feeds
JEDEC Staff
Website Help
Year in Review: 2023
Login required
Members Area
JC-64 Recent News
Discover the Future of Automotive Electronics: Join JEDEC’s Forum in San Jose on September 19th
Aug 2024
Intel CEO Pat Gelsinger Receives 2024 Distinguished Executive Leadership Award from JEDEC Board
Feb 2024
JEDEC Board Presents 2023 Distinguished Executive Leadership Award to AMD CEO Dr. Lisa T. Su
Aug 2023
JEDEC Publishes Automotive Solid State Drive (SSD) Device Standard
Dec 2022
JEDEC Updates Universal Flash Storage (UFS) and Supporting Memory Interface Standard
Aug 2022
JEDEC to Host In-Person Memory Forum and DDR5 Workshop
Apr 2022
JEDEC Recognizes Nantero’s Bill Gervasi with Award of Excellence
Dec 2021
JEDEC Publishes XFM Embedded and Removable Memory Device Standard to Expand Storage Solutions in Embedded and Automotive Applications
Aug 2021
JEDEC Advances Universal Flash Storage (UFS) Removable Card Standard 3.0
Dec 2020
JEDEC Publishes Update to Universal Flash Storage (UFS) Standard
Jan 2020
JEDEC Events: Memory Tutorials, Mobile/IOT & Automotive Forums
Feb 2018
JEDEC Publishes Universal Flash Storage (UFS & UFSHCI) Version 3.0 and UFS Card Extension Version 1.1
Jan 2018
JEDEC Updates Universal Flash Storage (UFS) and Related Standards
Apr 2016
JEDEC Publishes Universal Flash Storage (UFS) Removable Card Standard
Mar 2016
JEDEC to Update Solid State Drive Standard
Jun 2015
JEDEC Announces Publication of e.MMC Standard Update v5.1
Feb 2015
JEDEC Announces Publication of e.MMC Standard Update v5.0
Oct 2013
JEDEC Publishes Universal Flash Storage (UFS) Standard v2.0
Sep 2013
JEDEC, TSIA and KSIA to Host Mobile Technology Conferences in Asia
Jun 2013
JEDEC Publishes Test Standard for Universal Flash Storage (UFS)
Apr 2013
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